A Situationally Sample‐Size‐Adjusted Sampling Scheme Based on Process Yield Verification

Abstract

a This paper is motivated by Food Safety Modernization Act, signed into law by President Obama on Jan. 4, 2011, after several outbreaks of tainted foods have cost human health and contracted food-industry prosperity over the past decade. It develops a situationally sample-size-adjusted procedure, called a tightened-normal-tightened (TNT) sampling strategy, on the basis of yield-index (S pk ) verification of the production process, whose measurements, garnered from a key quality characteristic with bilateral specification limits, follow a normal distribution. In this paper, we firstly describe the sampling procedure of the S pk -TNT(n T , n N , k) inspection scheme whose sets of parameters include sample sizes for the tightened inspection (nT) and normal inspection (n N ), and the critical value (k). Those parameters are determined from the joint solution of two nonlinear inequalities complying with the tolerable vendor's risk, buyer's risk, the desired acceptable quality level (AQL) and limiting quality level (LQL). Then, the proposed S pk -TNT(n T , n N , k) schemes for several inspection standards, widely utilized in practice, are delineated, and their functioning behaviors and propensities are further investigated. Moreover, we compare the S pk -TNT(n T , n N , k) strategy with two unadjusted inspection schemes, S pk -tightened, S pk -T(n T , k), and S pk -normal, S pk -N(n N , k), to illustrate its inspection flexibility and efficiency in real applications. Finally, implementing with a vendorbuyer contract agreement using the S pk -TNT(n T , n N , k) sampling plan, a company inspecting the submitted universal-serialbus (USB) connectors demonstrates the applicability of our proposed methodologies.

Dynamic batch sentencing mechanisms for yield-based product acceptance determination with the simple linear profiles

“…In this paper, we use the idea of Soundararajan and Arumainayagam [42] and Wu et al [45] to reduce the complexity of the mathematical model and consider the relations hip between the two parameters as…”

A repetitive group sampling plan based on the lifetime performance index under gamma distribution

“…Process capability indices (PCIs) are used to measure and evaluate the quality of processes and products. In recent years, many scholars have developed numerous variables sampling plans based on various PCIs for different scenarios, such as Wu, 5 Wu et al, 6 Seifi and Nezhad, 7 Wu et al, 8 Lee et al, 9 Wu and Liu, 10 Wang and Wu, 11 Arizono et al, 12 Wu et al 13 and Wang et al. 14 Many popular PCIs, such as 𝐶 𝑝 , 𝐶 𝑝𝑘 , 𝐶 𝑝𝑚 , and 𝐶 𝑝𝑚𝑘 , are based on the following assumptions: (i) the process must be stable and not easily altered due to any factors.…”

Yield‐based variables repetitive group plan with a critical‐value‐adjusted mechanism

“…To overcome the drawbacks of SSPs, different PCI-based situational sampling strategies are developed following various circumstances and special needs. [10][11][12][13][14] The repetitive group sampling (RGS) plan is a designated sampling strategy with a flexible critical region for resampling, proposed by Sherman in 1965 15 for attributes inspection and has been extensively developed based on variables inspection to meet different perspectives in the past decade. [16][17][18][19][20][21][22][23][24][25][26] The conventional variables RGS (VRGS) plan have proved its outperformance due to the reduction of sample size for inspection compared with the SSP.…”

“…The PCI‐based single sampling plans (SSPs) are inadequate in some cases despite, the simplicity and intuition. To overcome the drawbacks of SSPs, different PCI‐based situational sampling strategies are developed following various circumstances and special needs 10–14 …”