2002
DOI: 10.1142/s0218625x02002622
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A Soft X-Ray Undulator Beamline at the Advanced Light Source With Circular and Variable Linear Polarization for the Spectroscopy and Microscopy of Magnetic Materials

Abstract: A new undulator beamline at the Advanced Light Source, Lawrence Berkeley National Laboratory is described. This new beamline has an Apple II type undulator which produces linearly and elliptically polarized X-rays. A high resolution monochromator directs the radiation to two branchlines. The first branchline is optimized for spectroscopy and accommodates multiple endstations simultaneously. The second branchline features a photoemission electron microscope. A novel feature of the beamline is the ability to pro… Show more

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Cited by 22 publications
(12 citation statements)
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“…45 Samples were cryogenically cooled to 13 K. Average probing depth in the total electron yield XAS detection mode was estimated to be approximately 5 nm, providing interface-sensitive information with minimal contribution from surface adsorbates. Measurements were carried out in near-grazing (30°) incidence geometry, enabling selective alignment of the X-ray electric field parallel to the ab-plane of the film for vertically-polarized light (E║ab), and almost parallel to the c-axis of the film for vertically polarized light (E║c).…”
Section: Methodsmentioning
confidence: 99%
“…45 Samples were cryogenically cooled to 13 K. Average probing depth in the total electron yield XAS detection mode was estimated to be approximately 5 nm, providing interface-sensitive information with minimal contribution from surface adsorbates. Measurements were carried out in near-grazing (30°) incidence geometry, enabling selective alignment of the X-ray electric field parallel to the ab-plane of the film for vertically-polarized light (E║ab), and almost parallel to the c-axis of the film for vertically polarized light (E║c).…”
Section: Methodsmentioning
confidence: 99%
“…This beamline uses a variable included angle grating monochromator and a vertical focusing mirror as detailed elsewhere [23]. Samples were mounted on a liquid helium cooled cold finger (Janis Research, Wilmington, MA) in UHV vacuum chamber.…”
Section: Methodsmentioning
confidence: 99%
“…In addition, an exhaustive characterization of such coherently-strained CaMnO3 films via XRD, x-ray reflectivity and atomic force microscopy was carried out by us in a prior study 20 , confirming crystallinity, tensile strain values, phase purity and coherence. Soft x-ray XAS measurements at the Mn L2,3 and O K absorption thresholds were carried out at the elliptically polarized undulator beamline 4.0.2 of the Advanced Light Source using the Vector Magnet endstation 21 . The average probing depth in the total electron yield XAS detection mode was estimated to be approximately 5 nm, providing optimal bulk-sensitivity to probe the buried CaMnO3 layer underneath the 3 nm-thick Pt cap.…”
Section: Textmentioning
confidence: 99%