2019
DOI: 10.1016/j.susc.2018.10.013
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A STM study of Ni-Rh bimetallic particles on reducible CeO2(111)

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Cited by 12 publications
(1 citation statement)
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“…Another persuasive technique for directly observing the SAC structure is by using Scanning Tunneling Microscopy (STM), in which the surface images of the conducting or semiconducting materials at the atomic level can be attained [251,252]. The typical advantage of STM is to in-situ track the reaction process on a well-defined surface and provides the opportunity to explore catalytic mechanisms in real time [253,254]. STM operates under ultra-high vacuum at the broadband temperature range from near − 273 • C to around 1027 • C [255,256].…”
Section: Scanning Tunneling Microscopymentioning
confidence: 99%
“…Another persuasive technique for directly observing the SAC structure is by using Scanning Tunneling Microscopy (STM), in which the surface images of the conducting or semiconducting materials at the atomic level can be attained [251,252]. The typical advantage of STM is to in-situ track the reaction process on a well-defined surface and provides the opportunity to explore catalytic mechanisms in real time [253,254]. STM operates under ultra-high vacuum at the broadband temperature range from near − 273 • C to around 1027 • C [255,256].…”
Section: Scanning Tunneling Microscopymentioning
confidence: 99%