2021 28th IEEE International Conference on Electronics, Circuits, and Systems (ICECS) 2021
DOI: 10.1109/icecs53924.2021.9665591
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A Stochastic Compact Model Describing Memristor Plasticity and Volatility

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Cited by 4 publications
(1 citation statement)
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“…Since 2008, using the multi-state characteristic of memristors in next-generation electronics has become a popular research direction because a single memristor can potentially replace multiple transistors, while performing the same logic function [22]. Nevertheless, multi-state memristors still face various challenges including retention degradation, vulnerability, device-to-device variations, cycle-to-cycle variations, process voltage temperature (PVT) variations, inaccurate modelling, complex control logic and excitation circuits, etc [23][24][25][26].…”
Section: Introductionmentioning
confidence: 99%
“…Since 2008, using the multi-state characteristic of memristors in next-generation electronics has become a popular research direction because a single memristor can potentially replace multiple transistors, while performing the same logic function [22]. Nevertheless, multi-state memristors still face various challenges including retention degradation, vulnerability, device-to-device variations, cycle-to-cycle variations, process voltage temperature (PVT) variations, inaccurate modelling, complex control logic and excitation circuits, etc [23][24][25][26].…”
Section: Introductionmentioning
confidence: 99%