MWP 2003 Proceedings. International Topical Meeting on Microwave Photonics, 2003.
DOI: 10.1109/mwp.2003.1422840
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A strained SiGe layer heterojunction bipolar phototransistor for short-range opto-microwave applications

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Cited by 27 publications
(22 citation statements)
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“…Silicon detector technology in silicon processes has been quite well established [43][44][45][46]. For radiation at 0.55 micron, pn configurations offer up to 0.6 A.W -1 at around 1-10 GHz, while for p-i-n configurations offer up to 0.3 A.W -1 and up to 20 GHz but at larger unit volumes of silicon.…”
Section: Cmos Optical Sourcesmentioning
confidence: 99%
See 1 more Smart Citation
“…Silicon detector technology in silicon processes has been quite well established [43][44][45][46]. For radiation at 0.55 micron, pn configurations offer up to 0.6 A.W -1 at around 1-10 GHz, while for p-i-n configurations offer up to 0.3 A.W -1 and up to 20 GHz but at larger unit volumes of silicon.…”
Section: Cmos Optical Sourcesmentioning
confidence: 99%
“…In the absence of an efficient light source at 1550nm, these systems currently operate mainly with external light sources. Si-Ge detector structures which is reasonable compatible with mainstream silicon technology [1][2][3][4][5][6], has hitherto been developed that offers detection at 850 nm wavelength and in high-speed SiGe technologies [45,46,47].…”
Section: Introductionmentioning
confidence: 99%
“…Silicon detector technology in silicon processes has been quite well established 46,47,48,49 . For radiation at 0.55 micron, pn configurations offer up to 0.6 A.W -1 at around 1-10 GHz, while for p-i-n configurations offer up to 0.3 A.W -1 and up to 20 GHz but at larger unit volumes of silicon.…”
Section: Silicon Germanium Bipolar Technologymentioning
confidence: 99%
“…In the absence of an efficient light source at 1550nm wavelength, these systems currently operate mainly with external light sources. A Si-Ge detector structure which is reasonable compatible with mainstream silicon technology 4,9 , has also been developed that offers detection at 850 nm wavelength and in high-speed SiGe technologies 48,49,50 . Recently, a Ge-on-Si laser source was announced by Lui et al in 2010 13 .…”
Section: Introductionmentioning
confidence: 99%
“…However, according to [15], at a given minimum emitter width, the reduction of the emitter length leads to a significant reduction of speed due to the difficulties of the electron flow whereas doubling the emitter width significantly increases the speed. Our laboratory presented the first single layer SiGe HPT in 2003 [4] and we have illustrated the impact of the substrate photo-current on the speed of the HPT in [3] by using the same SiGe HPT topology. This paper is a furtherance of our previous works that explores further the frequency response limitations of the device.…”
Section: Introductionmentioning
confidence: 99%