2007
DOI: 10.1149/1.2721765
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A Study of Anodically Grown Hydroxide Films on an Amorphous Ni[sub 78]Si[sub 8]B[sub 14] Alloy

Abstract: Films grown on amorphous Ni 78 Si 8 B 14 alloy and on polycrystalline Ni by polarization in 1 M KOH solution were analyzed by X-ray photoelectron spectroscopy ͑XPS͒ and scanning tunneling spectroscopy ͑STS͒. XPS investigations showed that the films formed on both the amorphous Ni 78 Si 8 B 14 alloy and polycrystalline Ni at open-circuit potential and after polarization at 0.4 V RHE consist of Ni͑OH͒ 2 , while the films formed after polarization at 0.5 V RHE consist of NiOOH. No traces of B or Si in the uppermo… Show more

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Cited by 8 publications
(9 citation statements)
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“…semi-conducting behaviour compared to Ni(OH) 2 and compared to the (oxy)hydroxides formed on pure Ni. [3] The 3d component in the valence band spectra of the polarised samples in Fig. 4 is shifted from E F towards higher binding energies and is broader compared to NiO.…”
Section: Resultsmentioning
confidence: 86%
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“…semi-conducting behaviour compared to Ni(OH) 2 and compared to the (oxy)hydroxides formed on pure Ni. [3] The 3d component in the valence band spectra of the polarised samples in Fig. 4 is shifted from E F towards higher binding energies and is broader compared to NiO.…”
Section: Resultsmentioning
confidence: 86%
“…XPS O 1s spectra (not shown) of NiOOH showed presence of an oxide component, which was absent in the Ni(OH) 2 ones (Ref. [3]). Figure 2 also shows that NiOOH was thicker than Ni(OH) 2 , and that the outermost surface of both films was enriched in Ni and depleted in B.…”
Section: Resultsmentioning
confidence: 98%
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