2003
DOI: 10.1016/s0026-2714(03)00251-8
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A study of considering the reliability issues on ASIC/Memory integration by SIP (System-in-Package) technology

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Cited by 8 publications
(1 citation statement)
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“…One of the crit-582 H. XU ET AL. ical issues in advanced microelectronic packaging is to develop high-density multilayer packaging substrates [1,2]. Currently, the conventional packaging substrates are usually produced based on the E-glass cloth-reinforced polymer matrix composite laminates as the substrate core, in which the E-glass cloths are employed as the reinforcing materials due to their outstanding electrical insulation and dielectric properties, good mechanical strength and modulus etc., and the polymer resins are used as the composite matrices.…”
Section: Introductionmentioning
confidence: 99%
“…One of the crit-582 H. XU ET AL. ical issues in advanced microelectronic packaging is to develop high-density multilayer packaging substrates [1,2]. Currently, the conventional packaging substrates are usually produced based on the E-glass cloth-reinforced polymer matrix composite laminates as the substrate core, in which the E-glass cloths are employed as the reinforcing materials due to their outstanding electrical insulation and dielectric properties, good mechanical strength and modulus etc., and the polymer resins are used as the composite matrices.…”
Section: Introductionmentioning
confidence: 99%