A study of I/sub DDQ/ subset selection algorithms for bridging faults

Abstract

Selecting a small subset of the set of functional vectors for performing IDDQ measurement has previously been .studied for leakage but not f o r bridging faults. Algorithms for this problem for all two line bridging faults, in combinational a n d sequential circuits, along with experimen,tal results are presented.

Algorithms to compute bridging fault coverage ofIDDQtest sets

“…To our knowledge, the only fault simulation algorithm for I DDQ tests for BFs in sequential circuits is due to Chakravarty and Thadikaran [1994;. For reasons discussed in Section 4.1, this algorithm is very time and space inefficient and cannot simulate BFs in large circuits.…”

Algorithms to select I DDQ measurement points to detect bridging faults

“…We present a novel solution, initially presented in [6], for this problem that can target any set of BFs, including the set of all BFs. The target set of BFs can contain BFs involving internal nodes of a gate.…”

Fault models and test generation for IDDQ testing

“…The techniques [20] SAF seq TPG for SAF Chen et al [9] TBF seq TPG for SAF, genetic algorithm Dalpasso et al [10] TBF comb SPICE, BDD Isern & Figueras [17] INTRA-SH, TBF comb TPG for SAF Reddy et al [29] INTRA-SH, TBF comb random tests, TPG for SAF Mahlstedt et al [23] INTRA-SH, TBF comb random tests, deterministic TPG Higami et al [13] INTRA Since measurement of IDDQ is a time-consuming process, reduction of IDDQ measurement v ectors is more effective for reducing the total testing time. Therefore a method to select a small number of IDDQ measurement vectors has been proposed in [5,6,8,14,16,20,26]. Target faults are USHs in [5,6,14,16], LEs in [8,26], and SAFs in [20].…”

“…Therefore a method to select a small number of IDDQ measurement vectors has been proposed in [5,6,8,14,16,20,26]. Target faults are USHs in [5,6,14,16], LEs in [8,26], and SAFs in [20]. The problem of selecting minimum IDDQ measurement v ectors can be formulated as a SETCOVER problem [5,6].…”

“…Target faults are USHs in [5,6,14,16], LEs in [8,26], and SAFs in [20]. The problem of selecting minimum IDDQ measurement v ectors can be formulated as a SETCOVER problem [5,6]. To solve the problem, a method using a detection matrix is ecient [14,16].…”