2005
DOI: 10.1016/j.jnoncrysol.2005.04.075
|View full text |Cite
|
Sign up to set email alerts
|

A study of thermally stimulated dielectric relaxation currents in Al/Lu2O3/Al thin-film sandwiches

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
1
1

Citation Types

0
7
0

Year Published

2007
2007
2023
2023

Publication Types

Select...
4

Relationship

1
3

Authors

Journals

citations
Cited by 4 publications
(7 citation statements)
references
References 15 publications
0
7
0
Order By: Relevance
“…Film configurations were obtained using a masking system. More deposition details may be found elsewhere [11,14]. After depositions the film thicknesses were measured accurately using an interference microscope.…”
Section: Materials and Samplementioning
confidence: 99%
See 4 more Smart Citations
“…Film configurations were obtained using a masking system. More deposition details may be found elsewhere [11,14]. After depositions the film thicknesses were measured accurately using an interference microscope.…”
Section: Materials and Samplementioning
confidence: 99%
“…Taking into account a strong dependence of the capacitance of structures on the voltage, as well as the results of our previous papers [10,11,14], we assumed that Schottky barriers are formed at metal/insulator boundaries. The capacitances of the depletion regions are…”
Section: Physical Modelmentioning
confidence: 99%
See 3 more Smart Citations