A study on the indexing method of the electron backscatter diffraction pattern assisted by the Kikuchi bandwidth

Peng, Fan; Zhang, Y.; Zhang, J.; Lin, Chucheng; Jiang, Chun-Yi; Miao, Hong; Zeng, Yi

doi:10.1111/jmi.12856

Cited by 4 publications

(3 citation statements)

References 13 publications

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“…The lengths of reciprocal‐lattice vectors were corrected, and the RLVs, after correction were used for calculating lattice spacing. Compared to our previous method of calculating the lattice spacing by bandwidth, 19 the new method significantly improved the calculation accuracy without considerably increasing the computation required. The results of five Kikuchi patterns with different clarity showed that this new method reduced the average error of interplanar spacings by 50.611% and achieved an average accuracy of 1.644% for lattice spacing.…”

Section: Introductionmentioning

confidence: 94%

A new method for calculating interplanar spacing to distinguish between similar phases in EBSD

Peng

Zhang

Liu

et al. 2023

Journal of Microscopy

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Commercial electron backscatter diffraction (EBSD) systems generally use interplanar angle matching for pattern indexing, and thus, they are unable to distinguish between some similar phases with close interplanar angles, such as Al and Si. The interplanar spacing is more diagnostic but generally difficult to apply in pattern indexing because it lacks precision. In this study, we proposed an efficient approach for accurately measuring interplanar spacing by correcting the reciprocal-lattice vector (RLV). The phase discrimination of Al and Si was performed by interplanar spacing matching. The Kikuchi bands were identified automatically by the self-developed method using pattern rotation combined with grey gradient recognition without the help of human eyes. The reliable RLV relationship was extracted by accurately drawing reciprocal-lattice vectors.The lengths of RLVs were corrected, and then the RLVs were used for evaluating lattice spacing. The results of five Kikuchi patterns with different clarity showed that this new method reduced the average error of interplanar spacings by 50.611% and achieved an average accuracy of 1.644% for lattice spacing calculation. The method could distinguish structures with a difference in lattice spacing of at least 3.3%. This method was also effective for fuzzy patterns and partially missing Kikuchi bands and might be used as a new strategy for improving the calculation accuracy of lattice spacing for fuzzy patterns. The method did not have additional requirements concerning the number of detected Kikuchi bands and poles. The accuracy of lattice spacing could be effectively improved by correcting the RLVs based on routine pattern recognition. This method might be used as an auxiliary approach to differentiate between similar phases and is well-adapted to the existing commercial EBSD system.

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Section: Introductionmentioning

confidence: 94%

A new method for calculating interplanar spacing to distinguish between similar phases in EBSD

Peng

Zhang

Liu

et al. 2023

Journal of Microscopy

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“…Any manual definition of band edges is a highly individual and therefore subjective and non-reproducible decision (Li & Han, 2015;Oishi-Tomiyasu et al, 2021). Peng et al (2020) used the band edges themselves to optimize the trace positions of the diffracting lattice planes required for pattern indexing. In the present work we use the first derivative, successfully introduced already by Alam et al (1954), Shorter & Dobson (1981) and Saowadee et al (2017), for an approximation of hkl to determine the mean lattice parameter a from them.…”

Section: Band Widthsmentioning

confidence: 99%

Use of electron backscatter diffraction patterns to determine the crystal lattice. Part 1. Where is the Bragg angle?

Nolze¹,

Tokarski²,

Rychłowski³

2023

J Appl Cryst

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The derivation of a crystal structure and its phase-specific parameters from a single wide-angle backscattered Kikuchi diffraction pattern requires reliable extraction of the Bragg angles. By means of the first derivative of the lattice profile, an attempt is made to determine fully automatically and reproducibly the band widths in simulated Kikuchi patterns. Even under such ideal conditions (projection centre, wavelength and lattice plane traces are perfectly known), this leads to a lattice parameter distribution whose mean shows a linear offset that correlates with the mean atomic number Z of the pattern-forming phase. The consideration of as many Kikuchi bands as possible reduces the errors that typically occur if only a single band is analysed. On the other hand, the width of the resulting distribution is such that higher image resolution of diffraction patterns, employing longer wavelengths to produce wider bands or the use of higher interference orders is less advantageous than commonly assumed.

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“…电子背散射衍射(EBSD)作为一种相对较新的显微结构分析手段，可以在较大范围内提供材料的取向、织构、相鉴定及含量分布等晶体学统计性信息 [1][2][3][4] ，为无机材料制备工艺的改善、微结构调控及性能优化提供了可靠的科学依据。Fang 等 [5] 通过 EBSD 技术对梯度纳米(GNG)金属铜进行表征，为解释其拉伸变形的机理提供了重要显微结构证据。 EBSD 还是研究涂层内部残余应力分布的最佳显微结构分析手段，为研究热障涂层的服役失效行为提供了重要支撑。EBSD 提供的所有晶体学信息都依赖对菊池衍射花样的分析 [6] ，菊池花样直观反映材料内部微观结构，其中，菊池带对应不同指数的晶面，菊池带的交点即菊池极代表晶带轴 [4] [7] 尝试利用对称性进行相鉴定，但因为晶面间距计算误差较大，只能依靠肉眼在菊池花样中识别对称轴，容易误判。通过菊池带宽度计算晶面间距的误差通常较大(5%~20%) [7][8] ，这是用菊池花样进行对称性分析的最大难点。我们前期工作对晶面间距进行了准确测量，平均相对误差为 2.6% [9] ，为准确识别对称轴奠定了基础，还可区分非对称轴。对 Si 单晶菊池花样的分析发现了类似三次轴的非对称轴，计算晶面间距发现，菊池带并不属于同一晶面族，不满足三次轴的条件，这是肉眼识别很容易误判的。晶面夹角可通过三维空间矢量计算获得 [10]…”

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Method of Crystal Structure Identification by Using Kikuchi Diffraction Patterns

Fan¹,

Zeng²

2021

Journal of Inorganic Materials

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Electron backscatter diffraction (EBSD) is an important microstructure analysis method in the field of inorganic materials research. The Kikuchi pattern obtained through EBSD is an intuitive reflection of the internal microscopic crystal structure of the material. In this paper, a method of crystal symmetry analysis and crystal structure identification by using Kikuchi patterns was proposed by recognizing the symmetry axis though Kikuchi patterns and using the law of crystal symmetry. The symmetry and crystal structure of three unknown samples were successfully determined by this method. One of the samples was identified to which crystal system it belongs, and the other two were fixed on some certain point groups. Through the determination of crystal system and point group, some phase identification results that do not conform to symmetry were excluded. It is indicated that the symmetry analysis of Kikuchi patterns is an effective way to identify the crystal structure and can significantly filter the phase database. Compared with the existing methods, this method greatly reduces the retrieval range of phase identification, and significantly improves the accuracy and reliability of phase identification. It is a promising indexing technique for the new generation of EBSD devices.

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A study on the indexing method of the electron backscatter diffraction pattern assisted by the Kikuchi bandwidth

Cited by 4 publications

References 13 publications

A new method for calculating interplanar spacing to distinguish between similar phases in EBSD

A new method for calculating interplanar spacing to distinguish between similar phases in EBSD

Use of electron backscatter diffraction patterns to determine the crystal lattice. Part 1. Where is the Bragg angle?

Method of Crystal Structure Identification by Using Kikuchi Diffraction Patterns

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