“…In order to perform better with minimal features, four different subsets of attribute sets are tested against some well-known classifiers like J48, OneR, RF, Naïve Bayes, Bagging, Simple Logistic, and Multi-Layer Perceptron on AWID dataset [57]. For a meaningful feature selection, an intelligent system was proposed in a study [58] by combining Simulated Annealing (SA) and SVM. It In [50], the authors combined Artificial Neural Network and a Bayesian net in order to form an ensemble classifier.…”