2023 IEEE International Conference on Edge Computing and Communications (EDGE) 2023
DOI: 10.1109/edge60047.2023.00021
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A Survey of Faults and Fault-Injection Techniques in Edge Computing Systems

Maryam Pourreza,
Priya Narasimhan
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Cited by 3 publications
(1 citation statement)
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“…In this paper, we look further into the faulty output characterization of a representative SMA building block in a real silicon overclocked environment. Specifically, the three major goals of this study are: (i) identify the nature of faulty output alteration from a standard SMA block for a holistic circuit-architectural understanding of the application-level error behavior; (ii) substantially improve SMA fault tolerant design by understanding how errors from overclocked hardware are far from a random distribution-a common assumption in a large body of software-based fault simulation works [16][17][18][19]; and (iii) use our extensive SMA timing error characterization to spawn a new class of predictive techniques to sustain application-level goals (e.g., high inference accuracy), while still operating at a lower voltage or higher clock speed. Many recent works that aim to predict timing errors in a processor or SMA pipeline are usually limited to speculating an error event rather than the erroneous output [20,21].…”
Section: Introductionmentioning
confidence: 99%
“…In this paper, we look further into the faulty output characterization of a representative SMA building block in a real silicon overclocked environment. Specifically, the three major goals of this study are: (i) identify the nature of faulty output alteration from a standard SMA block for a holistic circuit-architectural understanding of the application-level error behavior; (ii) substantially improve SMA fault tolerant design by understanding how errors from overclocked hardware are far from a random distribution-a common assumption in a large body of software-based fault simulation works [16][17][18][19]; and (iii) use our extensive SMA timing error characterization to spawn a new class of predictive techniques to sustain application-level goals (e.g., high inference accuracy), while still operating at a lower voltage or higher clock speed. Many recent works that aim to predict timing errors in a processor or SMA pipeline are usually limited to speculating an error event rather than the erroneous output [20,21].…”
Section: Introductionmentioning
confidence: 99%