A switched-capacitor digital capacitance meter

Matsumoto, Hiroki; Watanabe, Kentaro

doi:10.1109/tim.1986.6831769

Cited by 8 publications

(3 citation statements)

References 7 publications

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“…These attempts are generally based on: the ac bridge method, 1 capacitance-to-frequency conversion, 1,2 and charge and discharge methods. 3,4 Also, recently the new methods based on the switched-capacitor technique 5,6 and capacitance-to-phase angle conversion 7 have been reported.…”

Section: Introductionmentioning

confidence: 99%

A high precision method for measuring very small capacitance changes

Ashrafi

Golnabi

1999

Review of Scientific Instruments

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A novel method for measuring very small capacitance changes based on capacitance-to-phase angle conversion is introduced in this article. This new method is the improved or linearized version of the nonlinear capacitance-to-phase angle conversion method. The main features of this scheme are the very good linearity, extremely high stray immunity and a very high resolution. The experimental results of the prototype version of this scheme have also been reported. By using this prototype and a simple capacitive transducer, a minimum detectable distance of about 16 nm can be achieved. This means that a capacitance change of about 0.7 fF (0.7ϫ10 Ϫ15 F) in a capacitance of 22 pF can be resolved, so the minimum resolvable relative capacitance is about 32 ppm. By the theory it can be seen that the minimum resolvable relative capacitance of 2 ppm could be achieved by this method.

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Section: Introductionmentioning

confidence: 99%

A high precision method for measuring very small capacitance changes

Ashrafi

Golnabi

1999

Review of Scientific Instruments

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“…Switched capacitor techniques [4,5] are more suitable for integrated circuit design because of their complex structure. Problems arising with the need for reference capacitors are also evident in the charge amplifier technique proposed in [6].…”

Section: Introductionmentioning

confidence: 99%

Low-cost, high-precision measurement system for capacitive sensors

Kolle

O’Leary

1998

Meas. Sci. Technol.

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This paper describes a low-cost realization of a precision capacitance measurement instrument. The method is based on synchronous modulation and demodulation operating at a frequency of 100 kHz. A two-channel multiplying digital-to-analogue converter is used to generate a sinusoidal drive voltage and to perform multiplication with the demodulation signal. The modulation and demodulation signals are generated using a direct digital synthesizer, which is implemented using a field programmable gate array. Experimental results show a reproducibility of better than ±0.005% in the range from 50 pF to 600 pF.

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“…The Pulse Density Modulation (PDM) of a two states second-order sigma-delta modulator permits the implementation of these different kinds of outputs [4] , Moreover ASIC implementation in CMOS process are well known to be robust to technology process, quite easy and cheap to integrate thus quite well suited to mass-production [5] [6] . We present the design, realization and experimental results of a CMOS ASIC adapted to capacitance measurement, the interchangeability of the transducer is made possible thanks to gain and offset control.…”

Section: Introductionmentioning

confidence: 99%

An ASIC-based capacitance meter: principle, realization and experiments

Grisel

Gallorini²,

Abouchi³

IEEE 2002 28th Annual Conference of the Industrial Electronics Society. IECON 02

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Abslrcrcl -An Application Specific Integrated Circuit (ASIC) dedicated to capacitance measurement is presented. After introducing the key features of capacitance meters and the necessity to obtain compatibility with most industrial transducers, and dealing with design issues related to achievement of accuracy, we present the circuit description. The designed circuit is based on a second+rder switchedcapacitor Sigma-Delta modulator and includes Voltage output, frequency output and Pulse Width Modulation (PWM) output. The capacitance to measure is part of the first integrator. Calibration and temperature compensation are integrated in the ASIC. We then present the ASIC architecture (CMOS 0.8 pm) which occupies 3.1 mm' and give experimental results demonstrating the accuracy of the circuit. We conclude by giving the test measurements for the different parts of the circuits.I.

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A switched-capacitor digital capacitance meter

Cited by 8 publications

References 7 publications

A high precision method for measuring very small capacitance changes

A high precision method for measuring very small capacitance changes

Low-cost, high-precision measurement system for capacitive sensors

An ASIC-based capacitance meter: principle, realization and experiments

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