2023
DOI: 10.1016/j.vacuum.2023.112408
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A systematical investigation of layer growth rate, impurity level and morphology evolution in TiO2 thin films grown by ALD between 100 and 300 °C

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Cited by 6 publications
(3 citation statements)
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“…The high TDMAT/ H 2 O/air ALD GPC at 220 °C likely has a primary contribution from TDMAT decomposition. This decomposition typically would result in CVD-like deposition, which can increase the GPC due to the gas phase, non-surface limited reactions, as consistent with Xia et al [38]. We propose that during TDMAT/H 2 O/air ALD at 220 °C, competing reactions occur between TDMAT decomposition and surface adsorption and reaction, increasing the film growth rate and reducing anatase crystallization.…”
Section: Tdmat/h 2 O/air Ald Overviewsupporting
confidence: 87%
“…The high TDMAT/ H 2 O/air ALD GPC at 220 °C likely has a primary contribution from TDMAT decomposition. This decomposition typically would result in CVD-like deposition, which can increase the GPC due to the gas phase, non-surface limited reactions, as consistent with Xia et al [38]. We propose that during TDMAT/H 2 O/air ALD at 220 °C, competing reactions occur between TDMAT decomposition and surface adsorption and reaction, increasing the film growth rate and reducing anatase crystallization.…”
Section: Tdmat/h 2 O/air Ald Overviewsupporting
confidence: 87%
“…The main factors affecting the preparation of coatings by the ALD method include the precursor type, cycle time, and reaction temperature. 93 Heterojunction coatings prepared by the ALD method have demonstrated enhanced photoelectrochemical performance. 94 Wang et al 95 results demonstrated the excellent stability of the prepared coating, which can be attributed to the TiO 2 coating formed by the ALD method.…”
Section: Silar Methodmentioning
confidence: 99%
“…The ALD method enables the production of uniform and ultrathin coatings that conform to diverse substrate shapes without modifying their characteristics. The main factors affecting the preparation of coatings by the ALD method include the precursor type, cycle time, and reaction temperature . Heterojunction coatings prepared by the ALD method have demonstrated enhanced photoelectrochemical performance .…”
Section: Synthesis Methods Of Tio2-based Heterojunction Coatingmentioning
confidence: 99%