A test bench for accelerated thermal ageing of III&amp;#x2013;V concentration solar cells using forward bias injection

Immovilli, Fabio; Bianchini, Claudio; Bellini, A.; Sala, A.

doi:10.1109/ecce.2011.6063743

Cited by 7 publications

(2 citation statements)

References 22 publications

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“…Test B was designed to provide a contrast to test A, which is favorable for analyzing the predominant factor in degradation of solar cells. 17,18) Note that all the cells examined in this study were bare and exposed to the surrounding without coating with a silicone protective film to analyze sufficiently and accurately the degradation mechanism of cells. Finally, we used a solar simulator (WACOM WXS-155S-L2) to analyze the light current vs voltage (I-V ) characteristics of solar cells outside the SSADT measurement chamber.…”

Section: Regular Papermentioning

confidence: 99%

A Reliability Model of Concentrator Solar Receivers

Hong¹,

Huang²,

Wei³

et al. 2013

Jpn. J. Appl. Phys.

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The degradation mechanism of GaInP/GaInAs/Ge triple-junction solar cells without coating with any protective film was analyzed. After the step stress accelerated degradation test (SSADT) was performed on the solar cells under the sequential conditions of 90 °C for 25 h, 110 °C for 30 h, 130 °C for 30 h, and 150 °C for 50 h, the degradation of dark and light current vs voltage (I–V) characteristics was observed. It is supposed that the recombination current in the depletion region at the chip perimeter of solar cells is the most important degradation mechanism for GaInP/GaInAs/Ge triple-junction solar cells as well as the decreases in open-circuit voltage (V OC), fill factor (FF), and energy efficiency (η).

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Section: Regular Papermentioning

confidence: 99%

A Reliability Model of Concentrator Solar Receivers

Hong¹,

Huang²,

Wei³

et al. 2013

Jpn. J. Appl. Phys.

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“…However, it is not guaranteed that, for given component, with a well-modelled failure mechanism, the process of failure would be exactly the same at system level, since many cross interactions, that cannot be considered at component level, are instead fully present at system level [7], together with manufacturing or assembly faults [8].…”

Section: Introductionmentioning

confidence: 99%

Multistress Characterization of Fault Mechanisms in Aerospace Electric Actuators

Barater

Immovilli

Soldati

et al. 2017

IEEE Trans. on Ind. Applicat.

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Abstract1 -The concept behind the More Electric Aircraft (MEA) is the progressive electrification of on-board actuators and services. It is a way to reduce or eliminate the dependence on hydraulic, mechanical and the bleed air/pneumatic systems and pursue efficiency, reliability and maintainability. This paper presents a specialised test rig whose main objective is to assess insulation lifespan modelling under various stress conditions, especially investigating the interaction between ageing factors. The test set-up is able to reproduce a multitude of environmental and operational conditions at which electric drives and motors, used in aerospace applications, are subjected. It is thus possible to tailor the test cycle in order to mimic the working cycle of an electrical motor during real operation in aircraft application. The developed test-rig is aimed at projecting the technology readiness to higher levels of maturity, in the context of electrical motors and drives for aerospace applications. Its other objective is to validate and support the development of a comprehensive insulation degradation model.

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