2019
DOI: 10.1016/j.solmat.2019.110123
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A theoretical study on Sb2S3 solar cells: The path to overcome the efficiency barrier of 8%

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Cited by 40 publications
(3 citation statements)
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“…There are theoretical reports in literature corresponding to ETLs in Sb 2 S 3 solar cells in addition to the experimental work. In a theoretical simulation study about the solar cell device of the architecture glass/Au/Sb 2 S 3 /CdS/ZnO/ZnO:Al, Courel et al [122] reported that 11.8% PCE is attainable by improving Sb 2 S 3 bulk and CdS/Sb 2 S 3 interface quality. Furthermore, they proposed that by paying particular attention to the series and shunt resistances in the cell, the PCE could increase to 18.4%.…”
Section: Electron Transport Layersmentioning
confidence: 99%
“…There are theoretical reports in literature corresponding to ETLs in Sb 2 S 3 solar cells in addition to the experimental work. In a theoretical simulation study about the solar cell device of the architecture glass/Au/Sb 2 S 3 /CdS/ZnO/ZnO:Al, Courel et al [122] reported that 11.8% PCE is attainable by improving Sb 2 S 3 bulk and CdS/Sb 2 S 3 interface quality. Furthermore, they proposed that by paying particular attention to the series and shunt resistances in the cell, the PCE could increase to 18.4%.…”
Section: Electron Transport Layersmentioning
confidence: 99%
“…Additionally, Sb 2 S 3 presents numerous advantages including readily available raw materials, remarkable stability in the face of moisture and temperature, a direct bandgap of 1.62 eV, high absorption coefficient of 10 5 cm −1 , non-toxicity, carrier mobility of 9.8 cm 2 /Vs and 10 cm 2 /Vs for electrons and holes respectively, and p-type conductivity [8][9][10][11]. The reported efficiency of numerically simulated Sb 2 S 3 absorber based solar cell is 20.6% [12] and experimental efficiencies for single ETL solar cell are 6.18% [13], 7.5% [14], and 5.4% [15]. The experimental reported efficiency of Sb 2 S 3 absorber layer based double ETL solar cell is 5.3% [16].…”
Section: Introductionmentioning
confidence: 93%
“…The valence and conduction band edges of each layer relative to the vacuum level (in eV) before contact are also illustrated in figure 1. The parameters concerning the physical properties of the FTO, TiO 2 , CsPbI 3 and Sb 2 S 3 layers used for the calculation of the reference device have been extracted from previously published literature [14,[23][24][25][26][27] and are presented in table S1 (supplementary material). In the simulation process, except for the study variants, the other parameters default to be consistent with the reference device in table S1.…”
Section: Simulation Modelmentioning
confidence: 99%