Conference Record of the 1988 IEEE Industry Applications Society Annual Meeting
DOI: 10.1109/ias.1988.25136
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A thermal analogue of higher accuracy and factory test method for predicting and supporting thyristor fault suppression ratings

Abstract: Because s o p h i s t i c a t e d computer modeling i s n o t e a s i l y accessible, a one-dimensional thermal analogue i s o f t e n used f o r r o u t i n e c a l c u l a t i o n s o f v i r t u a l j u n c t i o n temperature o c c u r i n g i n t h y r i s t o r s when subjected t o f a u l t c u r r e n t s . Such models simul a t e t h e heat p a t h from w i t h i n t h e s i l i c o n wafer through t h e component p a r t s of t h e mechanical package o u t t o t h e e x t e r n a l case. The usual c … Show more

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Cited by 14 publications
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