2017
DOI: 10.1016/j.nimb.2017.01.011
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A time-resolved current method and TSC under vacuum conditions of SEM: Trapping and detrapping processes in thermal aged XLPE insulation cables

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Cited by 8 publications
(6 citation statements)
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“…At room temperature and at 50 °C, no detrapped charges occurred because of the relatively low applied temperature, so the resulting influence current maintains its null values. It has been evidenced in previous papers that XLPE has a strong ability to store charges at room temperature after stopping e-beam irradiation [ 17 , 23 ]. When the applied temperatures rise (80 °C and 90 °C), we notice an abrupt change of sign in the influence current that becomes positive.…”
Section: Resultsmentioning
confidence: 99%
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“…At room temperature and at 50 °C, no detrapped charges occurred because of the relatively low applied temperature, so the resulting influence current maintains its null values. It has been evidenced in previous papers that XLPE has a strong ability to store charges at room temperature after stopping e-beam irradiation [ 17 , 23 ]. When the applied temperatures rise (80 °C and 90 °C), we notice an abrupt change of sign in the influence current that becomes positive.…”
Section: Resultsmentioning
confidence: 99%
“…In Figure 3 b, we have presented the charging process giving the evolution of influence current during all the periods where the e-beam irradiation is on for each test temperature alone. The discharging process is given in Figure 3 c. From this exploded form, it is clear that at room temperature, the influence current takes the usual form [ 17 ]. It starts its evolution from a maximum (in absolute value) negative value and decays rapidly to reach zero after a few hundred seconds.…”
Section: Resultsmentioning
confidence: 99%
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“…The invariant conductivity is seen in samples aged such that CI > 0.4 is also consistent with such process, whereby an increase of the density of traps facilitates percolation processes. This effect of ageing at 120°C on the traps present in XLPE has been considered by Boukezzi et al [56], who estimated a resultant trap depth of 0.8–0.9 eV based upon their thermal stimulated current measurements.…”
Section: Ageing Morphology and Charge Transportmentioning
confidence: 91%
“…Although the EaB for both EPR The inconsistent behavior of the S r values at 1 s as shown in Figure 12, with radiation, indicates a parallel occurrence of a cross-linking reaction during irradiation. As the crosslinking reaction results in a three-dimensional network within the molecules, it restricts charge transportation mobility [35]. This can decrease the polarization conductivity and thus the S r value.…”
Section: Cspe Jacketmentioning
confidence: 99%