A time-resolved current method for the investigation of charging ability of insulators under electron beam irradiation

Song, Zhigang; Ong, C. K.; Gong, Hao

doi:10.1063/1.361427

Cited by 64 publications

(39 citation statements)

References 29 publications

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“…Using the published studies of samples under SEM beams [23][24][25][26] we estimate the ungrounded sample potential ∼10 kV determined by the beam energy and established in a matter of several minutes, i. -e. fast compared to our employed 10 hour stress protocol.…”

Section: Resultsmentioning

confidence: 99%

Electric field stimulated growth of Zn whiskers

et al. 2016

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We have investigated the impact of strong (∼10 4 V/cm) electric fields on the development of Zn whiskers. The original samples, with considerable whisker infestation were cut from Zn-coated steel floors and then exposed to electric fields stresses for 10-20 hours at room temperature. We used various electric field sources, from charges accumulated in samples irradiated by: (1) the electron beam of a scanning electron microscope (SEM), (2) the electron beam of a medical linear accelerator, and (3) the ion beam of a linear accelerator; we also used (4) the electric field produced by a Van der Graaf generator. In all cases, the exposed samples exhibited a considerable (tens of percent) increase in whiskers concentration compared to the control sample. The acceleration factor defined as the ratio of the measured whisker growth rate over that in zero field, was estimated to approach several hundred. The statistics of lengths of e-beam induced whiskers was found to follow the log-normal distribution known previously for metal whiskers. The observed accelerated whisker growth is attributed to electrostatic effects. These results offer promise for establishing whisker-related accelerated life testing protocols. C 2016 Author(s). All article content, except where otherwise noted, is licensed under a Creative Commons Attribution (CC BY) license

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Section: Resultsmentioning

confidence: 99%

Electric field stimulated growth of Zn whiskers

et al. 2016

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“…It is worth emphasizing that this experimental arrangement differs from that operated for electrets [21] and others [22,23] in two points. In one hand, the rear electrode (C) is not in contact with the insulating layer so only the electrostatic influence current I d is measured, whereas in other arrangements [21][22][23] where the insulator is in contact with the rear electrode, the radiation-induced conductivity (RIC) current, I RIC , for instance, is superimposed to I d .…”

Section: Methodsmentioning

confidence: 99%

Experimental characterisation of charge distribution and transport in electron irradiated PMMA

Fakhfakh¹,

Jbara²,

Rondot³

et al. 2012

Journal of Non-Crystalline Solids

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“…), and of the influence current, I(inf.) or displacement current (Song et al 1996). To separate the two contributions, Jbara et al (2002) improved the measurement technique by the use of two rear electrodes, one not in contact with the back of the specimen, to measure the influence current, I(inf.…”

Section: Experimental Supportmentioning

confidence: 99%

Charging in scanning electron microscopy “from inside and outside”

Cazaux¹

2004

Scanning

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Summary: This paper is an attempt to analyse most of the complicated mechanisms involved in charging and discharging of insulators investigated by scanning electron microscopy (SEM). Fundamental concepts on the secondary electron emission (SEE) yield from insulators combined with electrostatics arguments permit to reconsider, first, the widespread opinion following which charging is minimised when the incident beam energy E 0 is chosen to be equal to the critical energy E°2 , where the nominal total yield δ°+η°= 1. For bare insulators submitted to a defocused irradiation, it is suggested here that the critical energy under permanent irradiation E C 2 corresponds to a range of primary electrons, R, and nearly equals the maximum escape depth of the secondary electrons, r. This suggestion is supported by a comparison between published data of the SEE yield δ°o f insulators (short pulse experiments) and experimental results obtained from a permanent irradiation for E C 2 . New SEE effects are also predicted at the early beginning of irradiation when finely focused probes are used. Practical considerations are also developed, with specific attention given to the role of a contamination layer where a negative charging may occur at any beam energy. The role of the various time constants involved in charging and discharging is also investigated, with special attention given to the dielectric time constant, which explains the dose rate-dependent effects on the effective landing energy in the steady state. Numerical applications permit to give orders of magnitude of various effects, and several other practical consequences are deduced and illustrated. Some new mechanisms for the contrast reversal during irradiation or with the change of the primary electron (PE) energy are also suggested.

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A time-resolved current method for the investigation of charging ability of insulators under electron beam irradiation

Cited by 64 publications

References 29 publications

Electric field stimulated growth of Zn whiskers

Electric field stimulated growth of Zn whiskers

Experimental characterisation of charge distribution and transport in electron irradiated PMMA

Charging in scanning electron microscopy “from inside and outside”

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