1965
DOI: 10.1071/ph650135
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A Transmission Electron Microscope Study of Amethyst and Citrine

Abstract: SummaryThin crystals of amethyst and citrine were examined by transmission elflf'troJl microscopy. It was found that all crystals became damaged during observflti"ll. The diffraction contrast from the damage centres indicated that these were RmfLll amorphous regions. Electron spin resonance observations of these crystals show that the amorphous regions are associated with Fe3+ ions; the damage centres provide, therefore, a measure of the distribution of this impurity in the crystals. Brazil twin boundaries, ge… Show more

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Cited by 94 publications
(18 citation statements)
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“…This defect can form as a result of beam damage in quartz, by dissociation of strained Si-O bonds (Devine 1990;Stevens Kalceff and Phillips 1995). In TEM, localised electron beam damage at dislocations, Brazil twin boundaries and, to a lesser extent, Dauphiné twin boundaries are a commonly observed phenomenon and continued beam damage finally results in complete (local) amorphisation (Carter and Kohlstedt 1981;Cherns et al 1980;McLaren et al 1970;Comer 1972;McLaren and Phakey 1965). Similar damage caused by inelastic scattering of the incoming electrons also occurs in the SEM (Vigouroux et al 1985, Stevens Kalceff 2009 andreferences therein).…”
Section: Discussionmentioning
confidence: 84%
“…This defect can form as a result of beam damage in quartz, by dissociation of strained Si-O bonds (Devine 1990;Stevens Kalceff and Phillips 1995). In TEM, localised electron beam damage at dislocations, Brazil twin boundaries and, to a lesser extent, Dauphiné twin boundaries are a commonly observed phenomenon and continued beam damage finally results in complete (local) amorphisation (Carter and Kohlstedt 1981;Cherns et al 1980;McLaren et al 1970;Comer 1972;McLaren and Phakey 1965). Similar damage caused by inelastic scattering of the incoming electrons also occurs in the SEM (Vigouroux et al 1985, Stevens Kalceff 2009 andreferences therein).…”
Section: Discussionmentioning
confidence: 84%
“…Unfortunately, these specimens became damaged t o some extent by the electron beam during observation [6] and this seriously limited the time available for tilting the specimen into various diffracting conditions. 3.…”
Section: Methodsmentioning
confidence: 99%
“…Recently McLaren and Phakey [6] developed a simple method of preparing thin specimens of quartz suitable for transmission electron microscopy and have used tbis technique to examine the defect structures of a number of quartz minerals [7, 8,91.…”
Section: Introdactionmentioning
confidence: 99%
“…I n view of the increasing interest in olivine type structures, a transmission electron microscope study has been made of defects in alexandrite. Samples suitable for transmission electron microscopy were made from gem-quality single crystals of yellow chrysoberyl and alexandrite, both natural and synthetic, using a technique previously described [ 7 ] .…”
Section: Introductionmentioning
confidence: 99%