2011
DOI: 10.1016/j.rcim.2011.02.007
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A two-phase dynamic dispatching approach to semiconductor wafer testing

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Cited by 10 publications
(2 citation statements)
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“…All of the performance indices are transformed into a single index called the overall performance, using Eq. (13) and desirability function [10]. d ij indicates the desirability value of the ith performance measure in the observation j,Ẑ ij is the ith performance measure in the observation j.…”
Section: Simulation Factors and Responsesmentioning
confidence: 99%
“…All of the performance indices are transformed into a single index called the overall performance, using Eq. (13) and desirability function [10]. d ij indicates the desirability value of the ith performance measure in the observation j,Ẑ ij is the ith performance measure in the observation j.…”
Section: Simulation Factors and Responsesmentioning
confidence: 99%
“…They also present a rolling horizon method on a dynamic situation and show that their method is better than the other existing heuristic methods through computational experiments. Chen et al 29 propose a real-time dispatching algorithm for the wafer probe centers. They consider non-identical parallel machines and re-entrance of wafer lots for the wafer probe centers.…”
Section: Literature Reviewmentioning
confidence: 99%