2023
DOI: 10.1016/j.ijheatmasstransfer.2023.124555
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A two-step in situ measurement method for temperature and thermal stress of power device based on a single Raman peak

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Cited by 4 publications
(2 citation statements)
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“…As transistor fabrication processes shrink to the nanometer scale, the gate-all-around field-effect transistor (GAAFET) has emerged as a key technology to address issues such as electrostatic limitations, low carrier mobility, and electron tunneling. The GaN nanowire field-effect transistor (GaN NW FET) characterized by their high-speed electron transmission and saturation velocity properties, hold significant advantages in electronic applications. , However, the intrinsic Joule self-heating effect within the NW channel layer and nonuniform thermal stress generated at local high temperatures , in GaN NW FETs can hinder the performance of high-power devices. Currently, through device size scaling techniques, successful optimization of the channel dimensions of GAA devices has been achieved, finely tuning them to 3 nm .…”
Section: Introductionmentioning
confidence: 99%
“…As transistor fabrication processes shrink to the nanometer scale, the gate-all-around field-effect transistor (GAAFET) has emerged as a key technology to address issues such as electrostatic limitations, low carrier mobility, and electron tunneling. The GaN nanowire field-effect transistor (GaN NW FET) characterized by their high-speed electron transmission and saturation velocity properties, hold significant advantages in electronic applications. , However, the intrinsic Joule self-heating effect within the NW channel layer and nonuniform thermal stress generated at local high temperatures , in GaN NW FETs can hinder the performance of high-power devices. Currently, through device size scaling techniques, successful optimization of the channel dimensions of GAA devices has been achieved, finely tuning them to 3 nm .…”
Section: Introductionmentioning
confidence: 99%
“…Alternatively, Raman spectroscopy provides the capability to measure the temperature and pressure of fluid-lubricated films. Raman spectra contain the vibrational energy of the sample, which is affected by changes in temperature and pressure, thus offering the possibility of temperature and pressure measurements [15,16]. Jubault et al [17] used a coupled sphere/flat surface device and a Raman microphotometer to measure the pressure distribution of a model lubricant that occurs in a rolling EHD contact.…”
Section: Introductionmentioning
confidence: 99%