A Unified Framework to Explain Random Telegraph Noise Complexity in MOSFETs and RRAMs

Comprehensive Analysis of Read Fluctuations in ReRAM CiM by Using Fluctuation Pattern Classifier

“…Thus, memory non-idealities, including write variation and read-disturb [17] are the large issues in ReRAM CiM [16]. In addition, ReRAM has been suffered from its conductance fluctuation [2][3][4][5][6][7][18][19][20][21][22][23][24][25][26]. The main fluctuation pattern has been considered the random telegraph noise (RTN) conventionally, but there are still other fluctuation patterns are reported [2,[18][19][20][21][22]26].…”

“…In addition, ReRAM has been suffered from its conductance fluctuation [2][3][4][5][6][7][18][19][20][21][22][23][24][25][26]. The main fluctuation pattern has been considered the random telegraph noise (RTN) conventionally, but there are still other fluctuation patterns are reported [2,[18][19][20][21][22]26]. G. González-Cordero et al (2021) adopted self-organization map (SOM) to fluctuating signal analysis [26], but it does not work properly on our measured signals.…”