A unified mathematical approach to two-port calibration techniques and some applications

Soares, R.; Gouzien, P.; Legaud, P.; Follot, G.

doi:10.1109/22.41029

Cited by 75 publications

(12 citation statements)

References 8 publications

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“…In the TAN procedure, the measured T -parameters of the thru connection, matched attenuator standard and symmetrically reflecting network are, respectively, expressed as [5], [6], [23] T T = T X N 1 T Y (10)…”

Section: B Tad Algorithmmentioning

confidence: 99%

A Study on Network Analyzer Self-Calibration Using an Arbitrary Device

Chen

2013

IEEE Trans. Instrum. Meas.

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This paper studies the feasibility of calibrating a vector network analyzer with an arbitrary device serving as a calibration standard. The short-open-load-reciprocal and thruattenuator-network (TAN) procedures are, respectively, extended to develop short-open-load-device and thru-attenuator-device algorithms. The developed algorithms eliminate the limitations and broaden the applicable range of the thru-open-load-reciprocal and TAN procedures by using the device under test as a transfer standard. To benchmark the developed algorithms against the thru-reflect-line algorithm, experiments are conducted with a nonreciprocal device having theoretically symmetrical reflections. Results of the experiments verify the applicability of the developed algorithms.

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Section: B Tad Algorithmmentioning

confidence: 99%

A Study on Network Analyzer Self-Calibration Using an Arbitrary Device

Chen

2013

IEEE Trans. Instrum. Meas.

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“…Due to the inherent redundancy associated to the Network Analyzer self-calibration techniques [1,2,3,4], some calibration standards (shorts, opens, loads) need not be ideal and transmission line standards are not only possible but convenient. Multiple applications can be found in MIC, MMIC and on-wafer measurements [5].…”

Section: Inirqductiqnmentioning

confidence: 99%

Development of Self-Calibration Techniques for On-Wafer and Fixtured Measurements: A Novel Approach

Pradell

Caceres

Purroy

1992

22nd European Microwave Conference, 1992

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THEQEETIC_AL!CQNSI12ERATIONS 9N LMll TIRCHNIQ1lESWhen the LMR (Line-Match-Reflect) technique is applied to microstrip-Test-Fixture based chip transistor measurements, a practical drawback arises. In fact, the MATCH Standard r M should be ideal (FM = ) or perfectly known [4,7], a requirement that is difficult to meet in the higher frequency band (20 to 40 GHz) using chip microstrip-mounting loads. To circumvent the difficulty, one option is to assume a non-ideal unknown Match. In this case, the exact value of rM is not relevant for the calibration process (provided it is small and equal at both ports), but an accurate value for the Reflect Standard r R (equal at both ports) has to be provided to the calibration algorithm. The error commited assuming an ideal microstrip short is usually less than the error committed assuming an ideal microstrip load [6]. A similar argument can be used in the waveguide measurement case.The calibration equations for the case of known-Reflect LMR are not referenced in the literature. Following the same notation as in [4], it can be shown that:

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“…Usually, the TRL calibration uses the transmission parameters to represent both: the calibrations standards and the error boxes for modeling the imperfect VNA. Furthermore several works dealing with TRL calibration assume that the lines used in the calibrations process are nonreflecting [1], [3] [4], [5]. To the best of the author's knowledge the unique calibration technique that uses ABCD parameters is the LRRM [6].…”

Section: Introductionmentioning

confidence: 99%

What can the ABCD parameters tell us about the TRL?

Reynoso-Hernández

Pulido-Gaytan

Maya-Sanchez

et al. 2012

79th ARFTG Microwave Measurement Conference

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Using ABCD parameters and the 8-term error model to represent a non-ideal vector network analyzer (VNA), a new procedure for implementing the Thru-Reflect-Line calibration technique (TRL) is introduced. The novelty of this TRL is the use of ABCD-parameters, instead of transmission parameters, to represent a non-ideal vector network analyzer (VNA). Moreover, this new approach demonstrates, theoretically, the use of lines with complex characteristic impedance as calibration elements. To validate the new TRL procedure, the phase and magnitude of a waveguide sliding short is measured and corrected with the classical TRL. The results are in good agreement, which validates the proposed method.

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A unified mathematical approach to two-port calibration techniques and some applications

Cited by 75 publications

References 8 publications

A Study on Network Analyzer Self-Calibration Using an Arbitrary Device

A Study on Network Analyzer Self-Calibration Using an Arbitrary Device

Development of Self-Calibration Techniques for On-Wafer and Fixtured Measurements: A Novel Approach

What can the ABCD parameters tell us about the TRL?

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