for commercialization. [2,3] Thus, if metal halide perovskite (PSK) solar cells are to take part in supplying the world's energy demand, device stability must be significantly improved.Several kinds of stimuli have been found to degrade PSCs. When exposed to moist atmosphere, CH 3 NH 3 PbI 3 (MAPI) undergoes an irreversible degradation via the formation of hydrated phases. [4,5] Even the all-inorganic perovskite CsPbBr 3 undergoes intricate structural modifications when exposed to relative humidity (RH) above 60%, highlighting the sensitivity of lead halide perovskites to moisture also in the absence of organic cations. [6] Perovskites are also sensitive to atmospheric oxygen, which can rapidly diffuse inside the perovskite film through grain boundaries and inside the lattice via iodine vacancies. [7] Under illumination, the superoxide anion (O 2 − ) forms, which is highly reactive and triggers lattice decomposition. [8,9] Nevertheless, proper encapsulation procedures [10,11] can mitigate or, in the best scenario, eliminate the influence of moisture or oxygen on device stability. In addition to that, metal halide perovskites are also sensitive to heat, illumination, and electrical bias, three certain conditions in photovoltaic operation.
In perovskite solar cells (PSCs), the interfaces are a weak link with respect to degradation. Electrochemical reactivity of the perovskite's halides has been reported for both molecular and polymeric hole selective layers (HSLs), and here it is shown that also NiO brings about this decomposition mechanism.Employing NiO as an HSL in p-i-n PSCs with power conversion efficiency (PCE) of 16.8%, noncapacitive hysteresis is found in the dark, which is attributable to the bias-induced degradation of perovskite/NiO interface. The possibility of electrochemically decoupling NiO from the perovskite via the introduction of a buffer layer is explored. Employing a hybrid magnesiumorganic interlayer, the noncapacitive hysteresis is entirely suppressed and the device's electrical stability is improved. At the same time, the PCE is improved up to 18% thanks to reduced interfacial charge recombination, which enables more efficient hole collection resulting in higher V oc and FF.