A Useful Guide for X-Ray Stress Evaluation (XSE)

Abstract

This paper summarizes experiences available for the measurement of lattice strains in different materials with different wavelengths to evaluate stresses by means of X-rays. The recommendations given are based on previous statements. Some principles of fundamentals of X-ray physics for the recording of interference lines with Ω and ψ-diffractometers are dealt with. Methods applicable for the determination of the peak position of the interference lines, the assessment of linear and non-linear lattice strain distributions, and tine calculation of stresses are outlined. For iron, aluminium, copper, nickel and titanium the constants for practical X-ray stress evaluation (XSE) and the parameters of measurement are tabled.

Internal residual stresses in glass-ceramics: A review

“…Reviews on residual stress measurements by XRD can be found in the literature [38][39][40][41]. Diffraction is based on Bragg's law, which relates the interplanar distance of a particular hkl set of planes with the diffraction angle, θ.…”

Stress measurement in alumina scales on high temperature alloys using X-ray stress evaluation and laser Raman spectroscopy

“…Absorption correction, background subtraction, and Lorentz polarisation were applied [12]. Stresses were calculated according to the sin 2 ψ-method [13]. In LRS the line (λ = 457.9 nm) of an Ar + ion laser was used for excitation, a Dilor XY triple monochromator for analysis.…”

Residual stress analysis using overlapping diffraction peaks. Case of textured cubic materials

“…For residual stress determination from diffraction lineshift strain data the so-called 'sin2~k method' is well established. Review papers of the method have been given by DSlle (1979), James & Cohen (1980), Hauk (1984) and Hauk & Macherauch (1984). For texturefree materials the measured diffraction strain quite often exhibits straight-line behaviour when plotted vs sin2ff.…”

“…In practice reflections potentially useful for residual stress analysis until recently were not often used owing to overlap with other diffraction peaks. Several authors (Hauk, Oudelhoven & Vaessen, 1981;Hauk, 1984;Stuitje, 1985) have shown the practical viability of their application. It may be expected that their use for stress analysis will increase because of the availability of synchrotron and neutron radiation and also because of the advent of the position-sensitive detector (PSD).…”

“…reflection used on Ni specimens; and the (non-cubic) {122}, {203} and {301} reflections of s-quartz. These reflections have been used in practice (Hauk, 1984;Hauk & Vaessen, 1983). For other examples of coinciding reflections see Bunge (1982, p. 67).…”