2018
DOI: 10.3390/technologies6020055
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A Variable Control Chart under the Truncated Life Test for a Weibull Distribution

Abstract: In this manuscript, a variable control chart under the time truncated life test for the Weibull distribution is presented. The procedure of the proposed control chart is given and its run length properties are derived for the shifted process. The control limit is determined by considering the target in-control average run length (ARL). The tables for ARLs are presented for industrial use according to various shift parameters and shape parameters in the Weibull distribution. A simulation study is given for demo… Show more

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Cited by 9 publications
(9 citation statements)
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“…Ho and Quinino [2] proposed an attribute control chart for monitoring process variability. Khan et al [3] introduced the variable control chart under the truncated life test for Weibull distribution. Further details about attribute and variable control charts can be found in Epprecht et al [4], Chiu and Kuo [5], De Araujo Rodrigues et al [6], Joekes and Barbosa [7], Arif et al [8], and Rao et al [9] to mention but a few.…”
Section: Introductionmentioning
confidence: 99%
“…Ho and Quinino [2] proposed an attribute control chart for monitoring process variability. Khan et al [3] introduced the variable control chart under the truncated life test for Weibull distribution. Further details about attribute and variable control charts can be found in Epprecht et al [4], Chiu and Kuo [5], De Araujo Rodrigues et al [6], Joekes and Barbosa [7], Arif et al [8], and Rao et al [9] to mention but a few.…”
Section: Introductionmentioning
confidence: 99%
“…The HEWMA chart has the ability to detect a small shift in the process and outperforms EWMA and mixed charts. Khan, Aslam, Kim, and Jun (2017) proposed a mixed control chart for a life test by assuming that the quality characteristics follow the Weibull distribution. However, those studies are only for a univariate case which is decomposed into variables and attributes and simultaneously monitored using a single control chart.…”
Section: Introductionmentioning
confidence: 99%
“…Here, Table 5) VE D = 193.3 Joules (from Table 4) p = 1.5 [25] T c = 8240 s = 2.29 h (from Table 5) H = 24 h/day s = 1 (sample size as one for expensive system and long-life MRI product [2]) L = 10 years [1] W = 50 weeks/year D = 6 days/week From Equations (10), (11), (12), and (13), test duration can be calculated as follows. Accelerated system reliability growth test duration is reduced from 537 days to 55 days, which is a remarkable achievement for a MRI system with one sample size.…”
Section: Calculating Acceleration Factor and Test Durationmentioning
confidence: 99%
“…These techniques are reliability growth test [4][5][6][7], reliability demonstration test [2], Crow Army Material Systems Analysis Activity (AMSAA) test [8][9][10][11], life test [12,13], accelerated life test [14], and burn in test [15] etc. One of the challenges to perform the MRI system reliability test is sample size due to very high sample cost.…”
Section: Introductionmentioning
confidence: 99%