1999
DOI: 10.1016/s0584-8547(98)00206-7
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A wavelength dispersive X–ray spectrometer for small area X–ray fluorescence spectroscopy at SPring–8 BL39XU

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Cited by 20 publications
(6 citation statements)
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“…The details of the beamline optics was described by Hayakawa et al (5). The details of the beamline optics was described by Hayakawa et al (5).…”
Section: Methodsmentioning
confidence: 99%
“…The details of the beamline optics was described by Hayakawa et al (5). The details of the beamline optics was described by Hayakawa et al (5).…”
Section: Methodsmentioning
confidence: 99%
“…The energy resolution of the von Hamos spectrometer (ÁE VHS ) is determined by three contributions: ÁE D and ÁE cr are the Darwin width and stress-induced intrinsic broadening from the cylindrically bent crystal, respectively, while ÁE G is the angular divergence associated with the finite vertical size of the detector pixel (V pxl ) and the incident X-ray beam at the sample position (V beam ). These are convoluted assuming each of them is in a Gaussian profile for simplicity (Hayakawa et al, 1999),…”
Section: Experimental Setup At the Xss Hutchmentioning
confidence: 99%
“…ΔΘ summarizes any angular deviation from the exact Bragg angle. 29 ΔΘS = s 2 /OP is the angular divergence in the plane of diffraction caused by the finite source size s 2 along the dispersion direction Z. ΔΘD = D/OP is the angular divergence limited by the spatial resolution of the detector D. OP = 2R/sin(Θ B ) is the optical path length between the sample and the detector.…”
Section: Geometrical Contributionmentioning
confidence: 99%