A wide aperture high gain beam profile scanner

Rotating dual-wire beam profile monitor optimized for use in merged-beams experiments

“…Rotating wire scanners [10][11][12] (devices which detect secondary electrons that are emitted when a conducting wire is rotated through a particle beam) have long been used to measure beam profiles in real time, but can be problematic because the x and y profiles measured by a traditional single-wire scanner are acquired at different locations along the beam axis z. Beam profiles can change significantly even over the few centimeters between the locations of the x and y profiles typical in commercial rotating wire scanners. Additionally, the electron collection efficiency of the scanning system may depend on z, which compounds the difficulties in comparing x and y profiles while tuning.…”