“…The XRD pattern of ZL shows several sharp diffraction peaks at 2θ = 7.9, 8.7, 14.7, 23.0, 23.9 and 24.5°, which correspond to (011), (020), (031), (051), (303) and (313) planes of the ZSM-5 zeolite structure [14,32,33]. In contrast, the PP/OD composite film without ZL yielded an amorphous halo in the 2θ range of 15-25°a s well as four sharp diffraction peaks at 2θ = 14.0, 16.9, 18.5, and 21.5°, which are attributed to the (110), (040), (130), and (301) crystal planes of pure PP, respectively [34]. Furthermore, the XRD patterns of the five PP/OD/ZL composite films with 3-30 wt% ZL show several crystalline peaks that are almost identical to those observed for pure ZL in the 2θ range of 5-30°, with their intensities proportional to the ZL content [14,32].…”