PICMET '99: Portland International Conference on Management of Engineering and Technology. Proceedings Vol-1: Book of Summaries
DOI: 10.1109/picmet.1999.787852
|View full text |Cite
|
Sign up to set email alerts
|

A yield management strategy for semiconductor manufacturing based on information theory

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

0
0
0

Publication Types

Select...
2

Relationship

0
2

Authors

Journals

citations
Cited by 2 publications
references
References 19 publications
0
0
0
Order By: Relevance