Disordered pyrochlores Ce 2 Zr 2-x Si x O 7 (x = 0.0, 0.25, 0.50, and 0.75) with appropriate compositions have been manufactured by normal micro-emulsion method and the effects of Si doping on dielectric and electrical properties were observed. The as-synthesized materials were analyzed via various techniques including X-ray diffraction (XRD), Fourier transforms infrared (FTIR) spectroscopy, X-ray fluorescence (XRF) spectroscopy, Scanning electron microscopy (SEM), the temperature-dependent electrical capacity, and the frequency-dependent dielectric measurements. The XRD results revealed that the synthesized pyrochlores were single phased except x = 0 with crystallite size ranging from 18 to 30 nm. SEM analysis showed that particles were homogenous and well distributed. The resistivity of material first increased and then decreased showing metal to semiconducting transition. A decrease in dielectric properties with the increase in frequency was observed owing to natural magnetic resonance phenomenon. The dielectric and electrical measurements were enhanced by doping of Si contents which revealed that the prepared material is suitable for frequency filters, oscillators, and resonators.