2006
DOI: 10.1016/j.jpcs.2006.05.027
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Ab initio calculations of elastic constants of the bcc V–Nb system at high pressures

Abstract: 2 still leaves the softening of C 44 in this pressure region. We argue that the pressure induced shear instability (softening) of V (Nb) originates from the electronic system and can be explained by a combination of the Fermi surface nesting, electronic topological transition, and band Jahn-Teller effect.

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Cited by 49 publications
(72 citation statements)
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“…When comparing the band structure of RH1 to that of BCC, we find that the rhombohedral distortion splits the levels with t2g symmetry at Γ point. This effect is very similar to the Jahn-Teller distortion, and is consistent with the results of V as reported by Landa et al 15 and Ohta …”
Section: E Charge Transfer Induced Anomaliessupporting
confidence: 93%
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“…When comparing the band structure of RH1 to that of BCC, we find that the rhombohedral distortion splits the levels with t2g symmetry at Γ point. This effect is very similar to the Jahn-Teller distortion, and is consistent with the results of V as reported by Landa et al 15 and Ohta …”
Section: E Charge Transfer Induced Anomaliessupporting
confidence: 93%
“…For a cubic crystal, they are further reduced to only three, i.e., C11, C12 and C44. Our calculated elastic constants of Nb in BCC phase at the ground state, along with the available experimental 33 and other theoretical data, 15,16,19 are given in Table II softens at a pressure range of 20 to 150 GPa. The tetragonal shear modulus C' is also anomalously softening within the same pressure range.…”
Section: B Anomalies In Elastic Moduli At Zero Kelvinmentioning
confidence: 79%
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“…Conceptually, similar phenomena have been invoked to explain the observed rhombohedral distortion that occurs in vanadium [26] and the temperature dependence of the elastic moduli of niobium [27]. However, while theory elements [28][29][30], no experiments have indicated the presence of an anomalous softening of the transverse-acoustic phonons in Ta. We show why defect generation occurs not, as might naivel bethought, simply above a critical shear stress, but at acertain stress and strain (Fig.…”
Section: Modelmentioning
confidence: 94%