2020
DOI: 10.1016/j.ultramic.2020.113017
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Aberration corrected spin polarized low energy electron microscope

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Cited by 7 publications
(2 citation statements)
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“…Even atomic resolution can be achieved using SPM, and, in combination with I − V spectroscopy, access to the electronic properties can be gained that is complementary to ARPES. Here, we refrain from covering I − V spectroscopy and electron microscopy techniques, such as Lorentz transmission electron microscopy, [ 137 ] scanning electron microscopy with polarization analysis, [ 138 ] and spin‐polarized low‐energy electron microscopy, [ 139 ] because these techniques have not yet been used extensively for MTI research. The capabilities of the local probes covered here are illustrated in the upper half of the main panel in Figure 5.…”
Section: Magnetic Properties Of Ti Thin Films and Heterostructuresmentioning
confidence: 99%
“…Even atomic resolution can be achieved using SPM, and, in combination with I − V spectroscopy, access to the electronic properties can be gained that is complementary to ARPES. Here, we refrain from covering I − V spectroscopy and electron microscopy techniques, such as Lorentz transmission electron microscopy, [ 137 ] scanning electron microscopy with polarization analysis, [ 138 ] and spin‐polarized low‐energy electron microscopy, [ 139 ] because these techniques have not yet been used extensively for MTI research. The capabilities of the local probes covered here are illustrated in the upper half of the main panel in Figure 5.…”
Section: Magnetic Properties Of Ti Thin Films and Heterostructuresmentioning
confidence: 99%
“…Most SEM imaging uses low-energy secondary electrons. However, reflection electron microscopy 758,759 (REM) uses elastically backscattered electrons and is often complimented by a combination of reflection high-energy electron diffraction [779][780][781] (RHEED), reflection highenergy electron loss spectroscopy 782,783 (RHEELS) and spin-polarized low-energy electron microscopy [784][785][786] (SPLEEM). Some SEMs also detect Auger electrons 787,788 .…”
Section: Microscopesmentioning
confidence: 99%