Aberration-free imaging of inelastic-scattering spectra with x-ray echo spectrometers

Abstract

We study conditions for aberration-free imaging of inelastic x-ray scattering (IXS) spectra with x-ray echo spectrometers. Aberration-free imaging is essential for achieving instrumental functions with high resolution and high contrast. Computational ray tracing is applied to a thorough analysis of a 0.1-meV/0.07-nm −1 -resolution echo-type IXS spectrometer operating with 9-keV x-rays. We show that IXS spectra imaged by the x-ray echo spectrometer that uses lenses for the collimating and focusing optics are free of aberrations. When grazing-incidence mirrors (paraboloidal, parabolic Kirkpatrick-Baez, or parabolic Montel) are used instead of the lenses, the imaging system reveals some defocus aberration that depends on the inelastic energy transfer. However, the aberrationfree images can be still recorded in a plane that is tilted with respect to the optical axis. This distortion can be thus fully compensated by inclining appropriately the x-ray imaging detector, which simultaneously improves its spatial resolution. A full simulation of imaging IXS spectra from a realistic sample demonstrates the excellent performance of the proposed designs.