Aberrations estimate based on diffraction patterns using deep residual network
Jinyang Jiang,
Xiaoyun Liu,
Yonghao Chen
et al.
Abstract:Lenses are fundamental elements in many optical applications. However, various aberrations are inevitably present in lenses, which will affect the distribution of focused light intensity and optical imaging. Accurately predicting the aberrations of a lens is of great significance. Nevertheless, quantitatively measuring the aberrations of a lens, especially when multiple aberrations are present simultaneously, is a challenging task. In this paper, we propose a method based on a designed deep residual network ca… Show more
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