Ablation morphology and characteristic analysis of anisotropic conductive film (ACF) using femtosecond lasers with NIR, Green, and DUV wavelengths for micro-LED display repair

Choi, Junha; Cho, Kwangwoo; Cho, Sung-Hak

doi:10.1007/s00339-024-07287-z

Cited by 3 publications

(1 citation statement)

References 48 publications

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“…However, this section only briefly describes detection and repair technologies; for more detailed information, please refer to previous studies. [223][224][225] For commercial applications, a mass transfer yield of 99.9999% and the detection and repair of bad pixels after transfer are required. 223 Bad pixels are known to be caused by open circuits or short circuits that can occur during the LED fabrication and mass transfer process.…”

Section: Detection and Repair Processesmentioning

confidence: 99%

Recent advances in micro-pixel light emitting diode technology

Park,

Pristovsek,

Amano

et al. 2024

Applied Physics Reviews

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Display technology has developed rapidly in recent years, with III–V system-based micro-light-emitting diodes (μLEDs) attracting attention as a means to overcome the physical limitations of current display systems related to their lifetime, brightness, contrast ratio, response time, and pixel size. However, for μLED displays to be successfully commercialized, their technical shortcomings need to be addressed. This review comprehensively discusses important issues associated with μLEDs, including the use of the ABC model for interpreting their behavior, size-dependent degradation mechanisms, methods for improving their efficiency, novel epitaxial structures, the development of red μLEDs, advanced transfer techniques for production, and the detection and repair of defects. Finally, industrial efforts to commercialize μLED displays are summarized. This review thus provides important insights into the potential realization of next-generation display systems based on μLEDs.

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