2006
DOI: 10.1063/1.2358001
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Ablation of crystalline oxides by infrared femtosecond laser pulses

Abstract: We use focused laser pulses with duration of 180fs and wavelength of 800nm to study the interactions of high power near-infrared light with the surfaces of single-crystal transparent oxides (sapphire, LaAlO3, SrTiO3, yttria-stabilized ZrO2, and MgO); the morphologies of the ablation craters are studied by atomic force microscopy and scanning electron microscopy. With the exception of LaAlO3, the high temperature annealing of these oxide crystals produces atomically flat starting surfaces that enable studies of… Show more

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Cited by 17 publications
(12 citation statements)
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“…The gentle ablation fluence threshold observed is consistent with the value in [12]. Previous works on ultrafast laser structuring of sapphire show crater profiles with similar fluence-dependent strong and gentle ablation features upon irradiation with sub-200-fs pulses using both single- [17,18,34] and multiple-pulse irradiation [9,35].…”
Section: Resultssupporting
confidence: 86%
“…The gentle ablation fluence threshold observed is consistent with the value in [12]. Previous works on ultrafast laser structuring of sapphire show crater profiles with similar fluence-dependent strong and gentle ablation features upon irradiation with sub-200-fs pulses using both single- [17,18,34] and multiple-pulse irradiation [9,35].…”
Section: Resultssupporting
confidence: 86%
“…[16][17][18] In the near-threshold ablation regime, which for STO (Ref. 19) starts above 1.2 J/cm 2 , the major form of damage observed following ablation involves the formation of dislocation substructures immediately beneath the pulsed region. During irradiation by a femtosecond pulse (typically 150 fs for a Ti:Sapphire laser), the photon energy is absorbed by the electronic structure to 20-500 nm within the sample surface.…”
Section: Introductionmentioning
confidence: 99%
“…Films are grown epitaxially and are nearly single crystalline. 23 Attenuation is not limited by metal film grains or Cr/sapphire interface scattering but governed by intrinsic damping processes. 24,25 The thickness of the Cr probe films is d probe ϳ 20 nm while the Cr transducers at the pump side are d pump ϳ 100 nm thick.…”
Section: B Samples and Preparationmentioning
confidence: 99%