Industrial processes with high dimensional data are generally operated with mixed normal/faulty states in different modes which are difficult to be automatically and accurately identified. In this paper, a state identification framework is proposed for multimode processes. First, a key variable selection approach is presented based on sparse representation to eliminate redundant variables. Then, the modified density peak clustering (MDPC) is proposed to identify different states, in which a distance measurement with a time factor is constructed to select out all the possible cluster centers; and the sum of squared error(SSE) based approach is developed to determine the optimal cluster centers automatically. Further, considering that the mode attributes may be mixed with the fault attributes, a two-step “coarse-to-fine identification” strategy is designed to precisely identify the mode and the faults in each mode. Finally, three cases including a numerical simulation, Tennessee Eastman (TE) benchmark process and an actual semiconductor manufacturing process are given to show the feasibility of the proposed method.