2023
DOI: 10.1039/d2cp05837e
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About determining reliable etching rates and the role of temperature in kinetic experiments on acidic wet chemical etching of silicon

Abstract: A characteristic of the wet chemical etching of silicon in concentrated HF-HNO3 and HF-HNO3-H2SiF6 mixtures is the release of a high reaction heat, without its numerical value being known. This...

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Cited by 2 publications
(17 citation statements)
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“…Contrary to eqn (1), this process is not independent of the oxidation by nitric acid or the N(III) intermediate. Thus, an excess of the reactive N(III) species HNO 2 , which is indicated by a characteristic blue coloration of the etching mixture 7,9 caused by the dissolved N 2 O 3 present in the equilibrium, on the one hand results in the acceleration of the reaction 7,8,19 and on the other hand also in the suppression of hydrogen formation. 1 This reaction process and its stoichiometry, as well as the reaction rate, are sensitively affected by the reaction conditions, primarily the amount of etching mixture provided to dissolve the Si.…”
Section: Introductionmentioning
confidence: 99%
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“…Contrary to eqn (1), this process is not independent of the oxidation by nitric acid or the N(III) intermediate. Thus, an excess of the reactive N(III) species HNO 2 , which is indicated by a characteristic blue coloration of the etching mixture 7,9 caused by the dissolved N 2 O 3 present in the equilibrium, on the one hand results in the acceleration of the reaction 7,8,19 and on the other hand also in the suppression of hydrogen formation. 1 This reaction process and its stoichiometry, as well as the reaction rate, are sensitively affected by the reaction conditions, primarily the amount of etching mixture provided to dissolve the Si.…”
Section: Introductionmentioning
confidence: 99%
“…1 This reaction process and its stoichiometry, as well as the reaction rate, are sensitively affected by the reaction conditions, primarily the amount of etching mixture provided to dissolve the Si. 1,2,19 Consequently, the absence of H 2 formation throughout the complete mixing range (HF/HNO 3 ) and the exorbitantly high etching rates in the work of Robbins and Schwartz 3 can be explained retrospectively by using insufficient amounts of etching mixture in relation to the amount of dissolved silicon. 19 In addition, there is a disproportionately high heating of small amounts of etching mixture caused by the high exothermicity of the reaction process enthalpy of about À750 kJ mol À1 , which leads to the ''self-acceleration'' of the reaction.…”
Section: Introductionmentioning
confidence: 99%
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