Absolute cross sections for projectile-charge-state-correlated multiple-ionisation processes in Ne-Ne collisions

Ullrich, J.; Bethge, Κ.; Kelbch, S.; Schadt, W.; Schmidt‐Böcking, H.; Stiebing, K. E.

doi:10.1088/0022-3700/19/4/011

Cited by 24 publications

(14 citation statements)

References 23 publications

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“…That work was followed by others which, in addition to the recoil ions' charge states, projectile charge states were concomitantly measured to determine either pure multiple ionization cross sections, or cross sections for multiple ionization associated with electron capture or electron loss. Most of these experiments were designed to study the production of highly charged recoil ions by highly charged projectiles [7,8,[22][23][24] and only a few reported target multiple ionization by dressed projectiles with low-charge states (q 3) [11,[25][26][27], or molecular ions as projectiles [29,30].…”

Section: Introductionmentioning

confidence: 99%

Effectiveness of projectile screening in single and multiple ionization of Ne by B2+

et al. 2011

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Pure multiple ionization cross sections of Ne by B 2+ projectiles have been measured in the energy range of 0.75 to 4.0 MeV and calculated using the continuum distorted wave-eikonal initial state approximation. The experiment and calculations show that the ionization cross sections by B 2+ , principally for the production of highly charged recoils, is strongly enhanced when compared to the bare projectile with the same charge state, He 2+ , at the same velocities.

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Section: Introductionmentioning

confidence: 99%

Effectiveness of projectile screening in single and multiple ionization of Ne by B2+

et al. 2011

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“…However, a projectile cannot recoil an atom to a backward direction and furthermore an ionized atom being accelerated by only the Coulomb repulsive force cannot get a kinetic energy enough to overcome a surface potential within 10 −15 -10 −14 s. Then, a candidate for the emission process of the multiply charged P q+ ions is a simultaneous process of ionization and recoiling of atoms constituting the outermost atomic layer by a single MeVenergy projectile [4]. That is, first, the formation cross section of a given multiply charged ion was found to be calculated on the basis of an independent-electron model [25][26][27]. Second, as shown in Fig.…”

Section: Fig 3 S Ementioning

confidence: 99%

Secondary-ion emission from III-V semiconductive materials under MeV-energy heavy-ion bombardment

et al. 2004

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Secondary-ion emission from III-V semiconductive chemical compounds (InP, InAs, and InSb) has been experimentally studied at heavy-ion energies from 0.5 to 5.0 MeV, where electronic collision is a dominant process. Various secondary ions such as large cluster ions and atomic ions were observed. Yields of In atomic and cluster ions depend scantly on the incident energy, and those of group-V atomic ions and of cluster ions containing group-V elements can be expressed by an exponential function of S e −1 , where S e is the electronic stopping power. This fact shows that the ionization probabilities of the atoms and the clusters whose ionization potentials are higher than the work functions of target materials are increased by transient electronic excitation induced by ion bombardment. The energy distributions of the atomic ions show that the singly charged atomic ions are emitted through the linear collision cascade process even at MeV incident energies, and the multiply charged ions are produced by a projectile-induced simultaneous process of ionization and recoiling of atoms on the target surface. The yield dependences of the cluster ions on the electronic stopping power and on the cluster size are so much different from those for SiO 2. This fact precludes the multiple-bond-breaking process applied to the insulating material. Structural instabilities caused by high-density electronic excitations, which are known to take place in GaAs irradiated by slow multiply charged ions or lasers, are a possible cause of the cluster-ion emission from the semiconductive compounds at the MeV energy range.

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“…Despite the fact that the multiple ionization of rare gas targets in collision with ions has been extensively investigated over the past several decades, 1 it still continues to pose experimental [2][3][4][5][6][7][8][9][10][11][12][13][14][15] and theoretical challenges. 13,[16][17][18][19][20] For example, studies focused on the comparison between bare or partially stripped ions shed light on the role of the projectile effective charge state in direct multiple ionization processes of rare noble gases.…”

Section: Introductionmentioning

confidence: 99%

Electron-recoil ion and recoil ion-projectile coincidence techniques applied to obtain absolute partial collision cross sections

Wolff

Souza

Tavares

et al. 2012

Review of Scientific Instruments

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We present in detail an alternative experimental set-up and data analysis, based on the electron-recoil ion and recoil ion-projectile coincidence techniques, that enable the measurement of partial pure ionization and partial charge exchange cross sections for an effusive gas jet set-up, where the absolute target density and recoil ion efficiency cannot be measured directly. The method is applied to the ionization of helium atoms due to collision with partially stripped C(3 +) projectiles. In order to check the method, the results are compared to data available in the literature where the target density and recoil ion detection efficiency were measured directly. The pure ionization channel is compared to the electron capture channel.

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Absolute cross sections for projectile-charge-state-correlated multiple-ionisation processes in Ne-Ne collisions

Cited by 24 publications

References 23 publications

Effectiveness of projectile screening in single and multiple ionization of Ne by B2+

Effectiveness of projectile screening in single and multiple ionization of Ne by B2+

Secondary-ion emission from III-V semiconductive materials under MeV-energy heavy-ion bombardment

Electron-recoil ion and recoil ion-projectile coincidence techniques applied to obtain absolute partial collision cross sections

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