2003
DOI: 10.1088/0963-0252/12/4/307
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Absolute density distribution of H atoms in a large-scale microwave plasma reactor

Abstract: Absolute number densities and the spatial distribution of atomic hydrogen in a large-scale microwave plasma reactor were measured by means of two-photon absorption laser-induced fluorescence (LIF) with laser radiation at 205 nm. The microwave discharge was operated at 2.45 GHz with a maximum power of 2 kW. Absolute number densities were obtained by calibrating the LIF detection system via NO 2 titration in a flow tube reactor and in the range from 0.5 × 10 15 to 2.5 × 10 15 cm −3 . Compared to small-scale reac… Show more

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Cited by 10 publications
(10 citation statements)
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“…Another two‐photon LIF technique following excitation at 205.1 nm can be used to detect high‐density H atoms at more than 10 13 cm −3 21, 30, 50, 52, 54, 63–66, 70, 76, 82, 94, 103–119. In this case, H(1s 2 S) is excited to H(3s 2 S) and H(3d 2 D J ) states and Balmer‐α emission at 656.3 nm is monitored.…”
Section: Experimental Techniques For Detecting H Atoms In the Gas mentioning
confidence: 99%
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“…Another two‐photon LIF technique following excitation at 205.1 nm can be used to detect high‐density H atoms at more than 10 13 cm −3 21, 30, 50, 52, 54, 63–66, 70, 76, 82, 94, 103–119. In this case, H(1s 2 S) is excited to H(3s 2 S) and H(3d 2 D J ) states and Balmer‐α emission at 656.3 nm is monitored.…”
Section: Experimental Techniques For Detecting H Atoms In the Gas mentioning
confidence: 99%
“…Calibration techniques have been developed, therefore, in order to scale the relative values to absolute ones. Besides VUV absorption, titration is one of the most widely used techniques 66, 74, 77, 98, 103, 105, 106, 113, 117, 118. A discharge flow system is usually used in this technique.…”
Section: Experimental Techniques For Detecting H Atoms In the Gas mentioning
confidence: 99%
“…[3][4][5][6] In the literature, it is often speculated that the hydrogen to Si growth precursor flux ratio should exceed a critical value for the nucleation of crystalline phase material to occur. Although the atomic hydrogen flux during deposition can in principle be determined by advanced techniques such as two-photon laser induced fluorescence or mass spectrometry, 7,8 the technologically relevant data available concerning the abundance of atomic hydrogen during c-Si: H deposition remain largely based on correlations with indirect optical emission spectroscopy measurements and modeling work. 6,[9][10][11][12][13] Preferential insertion of atomic hydrogen in strained Si-Si bonds and subsequent silicon etching lead to a higher etch rate of amorphous silicon ͑a-Si: H͒ relative to crystalline Si.…”
mentioning
confidence: 99%
“…Since then, a plethora of experimental and numerical studies has emerged. These studies validated the excellent capability of TALIF to determine atomic densities in flames and plasmas [28,36,[39][40][41][42][43][44][45][46][47][48][49][50][51][52][53][54]. The concept of this method is depicted in Figure 2.…”
Section: Talif Principles Involved Theory and Experimental Requirementsmentioning
confidence: 56%