1999
DOI: 10.1063/1.125482
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Absolute measurement of penetration depth in a superconducting film by the two-coil technique

Abstract: Articles you may be interested inModeling the nanoscale linear response of superconducting thin films measured by a scanning probe microwave microscope

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Cited by 11 publications
(13 citation statements)
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“…12 It will therefore be interesting to test the microscopic theory using the experimental data, especially the low temperature data around and below T c,S Ј , which are previously not studied experimentally.…”
Section: Introductionmentioning
confidence: 99%
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“…12 It will therefore be interesting to test the microscopic theory using the experimental data, especially the low temperature data around and below T c,S Ј , which are previously not studied experimentally.…”
Section: Introductionmentioning
confidence: 99%
“…Since the two-coil technique requires a partial penetration of the magnetic field through the sample film, the film thickness should be limited in order to have a high accuracy in the measurements. 12 A second limitation for the samples comes from the theoretical side. Namely, one of the layers in an SSЈ sandwich should be thin compared to its coherence length so that the superconducting properties can be considered to be constant across the layer.…”
Section: Introductionmentioning
confidence: 99%
“…1 and 2. The present method allows us to make these measurements on thin-film samples just a few micrometers across, whereas the techniques employed by Wang et al [3] and Gubin et al [9], in common with others, required samples at least 10 mm in diameter. …”
Section: Application Of Nanosquids To Noninvasive Measurement Ofmentioning
confidence: 99%
“…Niobium is chosen as the basis of our low-temperature superconducting devices because of its long-established use, conveniently adjustable transition temperature T c (4.2-9.4 K) [3], and the availability of suitable fabrication and clean-room facilities. Niobium films are deposited by dc magnetron sputtering from a 99.999% pure target onto oxidized silicon wafers or other suitable substrates (e.g., MgO and Al 2 O 3 ) held near room temperature in an ultrahigh-vacuum chamber with a base pressure around 10 −7 Pa. By controllably varying the film thickness from 14 to 200 nm, a range of T c from 5 to 9 K is achieved for the purposes of our experiment [4], [5].…”
Section: Film Deposition Device Fabrication and Testingmentioning
confidence: 99%
“…In many practical situations, where the film thickness may be of the order 10 -20 nm, this condition prevails at temperatures between T c /2 and T c , where T c is the superconducting transition temperature. In published work, measurements of the penetration lengths in thin superconducting films have been based on the 2-coil method of Fiory et al [2] or variations thereof (eg Claassen et al [3]., Wang et al [4], ) where the lateral dimensions of the film are necessarily on the order of 10 mm due to the dimensions of practical wirewound coils. Other techniques based on measuring the change in resonant frequency of a microwave cavity, and on measuring the transmission of microwaves through the film, have also been recently described (Gubin et al, [5]).…”
Section: Introductionmentioning
confidence: 99%