Absolute Measurement of the (220) Lattice Plane Spacing in a Silicon Crystal

Becker, Peter; Dorenwendt, K.; Ebeling, G.; Lauer, Rolf; Lucas, W.; Probst, R; Rademacher, H.-J.; Reim, G.; Seyfried, P.; Siegert, H.

doi:10.1103/physrevlett.46.1540

Cited by 226 publications

(67 citation statements)

References 10 publications

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“…1 The relative uncertainty of this measurement was 3 × 10 −7 [19,20]. In 1981, the Physikalisch-Technische Bundesanstalt (PTB) reported an X-ray/optical interferometer measurement of the lattice spacing of a Si material produced by Wacker-Chemitronic called WASO 4.2a [21]. The relative uncertainty of this measurement was 6 × 10 −8 .…”

Section: Standard Crystalsmentioning

confidence: 99%

The Lattice Spacing Variability of Intrinsic Float-Zone Silicon

Kessler¹,

Szabo²,

Cline³

et al. 2017

J. RES. NATL. INST. STAN.

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Precision lattice spacing comparison measurements at the National Institute of Standards and Technology (NIST) provide traceability of X-ray wavelength and powder diffraction standards to the international system of units (SI). Here, we both summarize and document key measurements from the last two decades on six lots of intrinsic float-zone silicon, including unpublished results and recent internal-consistency checks. The comparison measurements link the unknown lattice spacing of a test crystal to a standard crystal for which the lattice spacing has been accurately determined by X-ray/optical interferometry in units traceable to the definition of the meter. The crystal that serves as the standard in all the comparisons is WASO 04, for which the lattice spacing is known with a relative uncertainty of 5 × 10 ; taking material variability into account, measurements yield relative uncertainties for the test materials of a few tens of nanometers. It is observed that in the case of nearly perfect modern intrinsic float-zone silicon, the variability of the lattice spacing is sufficiently small that for most diffraction applications, a recommended reference value may be used.

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Section: Standard Crystalsmentioning

confidence: 99%

The Lattice Spacing Variability of Intrinsic Float-Zone Silicon

Kessler¹,

Szabo²,

Cline³

et al. 2017

J. RES. NATL. INST. STAN.

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“…This has been linked to the international metre to a precision of + 6 parts in 108, at the PTB, Germany (Becker et al, 1981;Becker, Seyfried & Siegert, 1982). The value of the lattice parameter found for pure silicon was ao--0.543 102018 (34) nm.…”

Section: Theory Of the Methodsmentioning

confidence: 99%

A Method for the Accurate Comparison of Lattice Parameters

Bowen¹,

Tanner²

1995

J Appl Cryst

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A new method of comparison of lattice parameters is described. The method uses a standard double-crystal diffractometer, fitted with a specimen rotation stage, which compensates for tilt errors on the specimen setting. Some improvement is possible through the use of a monochromatizing system with a well defined wavelength. The use of a single reference standard enables the instrument zero to be accurately determined; the use of a second reference or a different reflection from the first allows the wavelength to be accurately determined. The errors are carefully assessed and it is shown that some errors important in other methods are self-cancelling through the use of the rotation stage, which need not itself be an ultraprecision component. Peak location to a confidence level of 10" permits absolute traceable latticeparameter determination to a few tens of parts in 10 6, with much greater relative sensitivity. The method is verified using both a tangent-arm-driven and direct-drive double-axis diffractometer at room temperature on samples of semi-insulating gallium arsenide. Comparison of the lattice parameter of a sample using this method and the conventional Bond technique is satisfactory.

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“…Therefore, the surface of the sphere needs to be chemically and physically characterized on an atomic scale (see section 7). After determination of the sphere mass, m sphere , and the mass of the surface layers, m SL , the core mass is obtained as …”

Section: Principle Of the Xrcd Methodsmentioning

confidence: 99%

“…However, the value of the lattice constant reported therein has an offset of about 1.8 parts in 10 6 . In the 1980s, using the x-ray interferometer, Becker et al [7] reported a reliable value of the Si crystal lattice constant with a relative standard uncertainty of 6.2 × 10 −8 . This value is still consistent with updated values for Si crystals with natural isotopic compositions [8].…”

Section: Introductionmentioning

confidence: 99%

Realization of the kilogram by the XRCD method

Fujii¹,

et al. 2016

Self Cite

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When the kilogram is redefined in terms of the fixed numerical value of the Planck constant h, the x-ray-crystal-density (XRCD) method, among others, is used for realizing the redefined kilogram. The XRCD method has been used for the determination of the Avogadro constant N A by counting the number of atoms in a 28 Si-enriched crystal, contributing to a substantial reduction of uncertainty in the values of N A and h to 2 parts in 10 8 . This method can be therefore used reversely for the mass determination of a 1 kg sphere prepared from the crystal. This is realized by SI-traceable measurements of its lattice parameter, isotopic composition, volume, and surface properties. Details of the corresponding measurements are provided, as well as the concept of the XRCD method, isotope enrichment, crystal production, sphere manufacturing, and evaluation of impurities and self-point defects in the crystal, together with mass comparison with respect to the silicon sphere for disseminating mass standards.

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Absolute Measurement of the (220) Lattice Plane Spacing in a Silicon Crystal

Cited by 226 publications

References 10 publications

The Lattice Spacing Variability of Intrinsic Float-Zone Silicon

The Lattice Spacing Variability of Intrinsic Float-Zone Silicon

A Method for the Accurate Comparison of Lattice Parameters

Realization of the kilogram by the XRCD method

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