1991
DOI: 10.1088/0031-8949/43/4/002
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Absolute photometry of pulsed intense fluxes of ultrasoft X-ray radiation

Abstract: A method of absolute intensity measurement of intensive impulse fluxes has been described. Method and primary absolute detector devicephotoionization quantometerare based on fundamental cross sections of photoionization and ionization by electron impact. New soft X-ray optic elements multilayer mirrors (MLM) were tested and used for constructing a 10-channel spectroanalyzer (polychromator) for photon energy range 0.1-1 .O keV. Results of polychromator using at "Angara-5-1" installation are presented.

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Cited by 16 publications
(2 citation statements)
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“…22 The recently developed 4-and 5-channel polychromators allow a continuous wavelength scan in each channel without breaking vacuum. 22 The recently developed 4-and 5-channel polychromators allow a continuous wavelength scan in each channel without breaking vacuum.…”
Section: Application Of Multilayer Dispersion Elements 231 Fluoresmentioning
confidence: 99%
“…22 The recently developed 4-and 5-channel polychromators allow a continuous wavelength scan in each channel without breaking vacuum. 22 The recently developed 4-and 5-channel polychromators allow a continuous wavelength scan in each channel without breaking vacuum.…”
Section: Application Of Multilayer Dispersion Elements 231 Fluoresmentioning
confidence: 99%
“…During the last ten years new spectroscopic methods and devices were developed for accurate absolute measurements of the soft-X-ray emission from intense impulse sources [2]. The techniques were based on a combination of new optical elements -the so called multilayer mirrors (MLM) -and on the progress in production and calibration of semiconductor detectors with high sensitivity in SXR and high temporal resolution.…”
mentioning
confidence: 99%