Absolute surface coverage measurement using a vibrational overtone

Pipino, Andrew C. R.; Hoefnagels, Jpm Johan; Watanabe, Noboru

doi:10.1063/1.1637338

Cited by 39 publications

(53 citation statements)

References 75 publications

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“…[3][4][5] Currently, three different implementations of EW-CRDS have been explored. The use of a monolithic ring cavity was already suggested and demonstrated a decade ago 6,7 by Pipino et al In follow-up studies, monolithic or folded resonators were used; [8][9][10] this is an elegant solution to minimize intrinsic cavity losses, but the requirements on the surface quality, the morphology of the TIR surfaces, and the purity of the resonator material are very stringent. The principle of fiber-loop CRDS has been explored by O'Keefe's group, who constructed a high-finesse fiber cavity by utilizing fiber-Bragg gratings (FBGs) as reflectors.…”

Section: Introductionmentioning

confidence: 99%

Evanescent-Wave Cavity Ring-Down Spectroscopy for Enhanced Detection of Surface Binding under Flow Injection Analysis Conditions

Sneppen

Ariese

Gooijer

et al. 2008

Laser Applications to Chemical, Security and Environmental Analysis

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The feasibility of liquid-phase evanescent-wave cavity ring-down spectroscopy (EW-CRDS) for surface-binding studies under flow-injection analysis (FIA) conditions is demonstrated. The EW-CRDS setup consists of an anti-reflection coated Dove prism inside a linear cavity (with standard or super-polishing of the total internal reflective (TIR) surface). A teflon spacer with an elliptical hole clamped on this surface acts as a 20 lL sized flow cell. The baseline noise of this system is of the order of 10 À4 absorbance units; the baseline remains stable over a prolonged time and the prism surface does not become contaminated during repeated injections of the reversibly adsorbing test dyes Crystal Violet (CV) and Direct Red 10 (DR10). At typical FIA or liquid chromatography (LC) flow rates, the system has sufficient specificity to discriminate between species with different surface affinities. For CV a much stronger decrease in ringdown time is observed than calculated based on its bulk concentration and the effective depth probed by the evanescent wave, indicating binding of this positively charged dye to the negatively charged prism surface. The amount of adsorption can be influenced by adjusting the flow rate or the eluent composition. At a flow rate of 0.5 mL/min, an enrichment factor of 60 was calculated for CV; for the poorly adsorbing dye DR10 it is 5. Super-polishing of the already polished TIR surface works counterproductively. The adsorbing dye Crystal Violet has a detection limit of 3 lM for the standard polished surface; less binding occurs on the superpolished surface and the detection limit is 5 lM. Possible applications of EW-CRDS for studying surface binding or the development of bio-assays are discussed.

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Section: Introductionmentioning

confidence: 99%

Evanescent-Wave Cavity Ring-Down Spectroscopy for Enhanced Detection of Surface Binding under Flow Injection Analysis Conditions

Sneppen

Ariese

Gooijer

et al. 2008

Laser Applications to Chemical, Security and Environmental Analysis

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“…This technique can be applied for H-depth profiling and to determine the H surface coverage of a-Si:H [3,9]. The same optical port will also be used in future studies in which dangling bonds will be probed at subgap energies by applying the evanescent-wave cavity ringdown technique [10,11]. Dangling bonds will also be studied from the front side of the substrate (35º port) using the surface-specific technique of second harmonic generation (SHG) [12].…”

Section: Methodsmentioning

confidence: 99%

New ultrahigh vacuum setup and advanced diagnostic techniques for studying a-Si:H film growth by radical beams

et al. 2004

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• A submitted manuscript is the author's version of the article upon submission and before peer-review. There can be important differences between the submitted version and the official published version of record. People interested in the research are advised to contact the author for the final version of the publication, or visit the DOI to the publisher's website.• The final author version and the galley proof are versions of the publication after peer review.• The final published version features the final layout of the paper including the volume, issue and page numbers. General rights Copyright and moral rights for the publications made accessible in the public portal are retained by the authors and/or other copyright owners and it is a condition of accessing publications that users recognise and abide by the legal requirements associated with these rights. Link to publication• Users may download and print one copy of any publication from the public portal for the purpose of private study or research.• You may not further distribute the material or use it for any profit-making activity or commercial gain • You may freely distribute the URL identifying the publication in the public portal ? Take down policyIf you believe that this document breaches copyright please contact us providing details, and we will remove access to the work immediately and investigate your claim. ABSTRACTA new ultrahigh vacuum setup is presented which is designed for studying the surface science aspects of a-Si:H film growth using various advanced optical diagnostic techniques. The setup is equipped with plasma and radical sources which produce well-defined radicals beams such that the a-Si:H deposition process can be mimicked. In this paper the initial experiments with respect to deposition of a-Si:H using a hot wire source and etching of a-Si:H by atomic hydrogen are presented. These processes are monitored by real time spectroscopic ellipsometry and the etch yield of Si by atomic hydrogen is quantified to be 0.005±0.002 Si atoms per incoming H atom.

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“…As O-H and C-H groups have been observed in the Er-doped Y 2 O 3 , an attempt was made to detect these species by CRDS by probing possible overtone and combination modes of O-H and C-H vibrations. Recently, CRDS in the evanescent-wave configuration 46,47 ͑EW-CRDS͒ was found to be highly sensitive for the detection of C-H overtones of surface adsorbed chloroethylenes, 48 surface Si dangling bonds in amorphous hydrogenated silicon ͑a-Si:H͒ films, 49 and O-H combination bands on amorphous SiO 2 . 50 Using the linear cavity in the current experiments, no absorption peaks could be observed in the wavelength region of 1000-1125 nm; however, an absorption peak could be clearly observed between 1360 and 1400 nm for the second wavelength scan, as shown in Fig.…”

Section: Quantification Of Oh and Chmentioning

confidence: 99%

Optical properties of Y2O3 thin films doped with spatially controlled Er3+ by atomic layer deposition

Hoang¹,

Van²,

Sawkar-Mathur³

et al. 2007

Journal of Applied Physics

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Document VersionPublisher's PDF, also known as Version of Record (includes final page, issue and volume numbers)Please check the document version of this publication:• A submitted manuscript is the author's version of the article upon submission and before peer-review. There can be important differences between the submitted version and the official published version of record. People interested in the research are advised to contact the author for the final version of the publication, or visit the DOI to the publisher's website.• The final author version and the galley proof are versions of the publication after peer review.• The final published version features the final layout of the paper including the volume, issue and page numbers. Link to publication General rightsCopyright and moral rights for the publications made accessible in the public portal are retained by the authors and/or other copyright owners and it is a condition of accessing publications that users recognise and abide by the legal requirements associated with these rights.• Users may download and print one copy of any publication from the public portal for the purpose of private study or research.• You may not further distribute the material or use it for any profit-making activity or commercial gain • You may freely distribute the URL identifying the publication in the public portal ? Take down policyIf you believe that this document breaches copyright please contact us providing details, and we will remove access to the work immediately and investigate your claim. We report in this work the optical properties of Er 3+ -doped Y 2 O 3 , deposited by radical enhanced atomic layer deposition. Specifically, the 1.53 m absorption cross section of Er 3+ in Y 2 O 3 was measured by cavity ring-down spectroscopy to be ͑1.9± 0.5͒ ϫ 10 −20 cm 2 , about two times that for Er 3+ in SiO 2 . This is consistent with the larger Er 3+ effective absorption cross section at 488 nm, determined based on the 1.53 m photoluminescence yield as a function of the pump power. X-ray photoelectron spectroscopy and Rutherford backscattering spectroscopy were used to determine the film composition, which in turn was used to analyze the extended x-ray absorption fine structure data, showing that Er was locally coordinated to only O in the first shell and its second shell was a mixture of Y and Er. These results demonstrated that the optical properties of Er 3+ -doped Y 2 O 3 are enhanced, likely due to the fully oxygen coordinated, spatially controlled, and uniformly distributed Er 3+ dopants in the host. These findings are likely universal in rare-earth doped oxide materials, making it possible to design materials with improved optical properties for their use in optoelectronic devices.

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Absolute surface coverage measurement using a vibrational overtone

Cited by 39 publications

References 75 publications

Evanescent-Wave Cavity Ring-Down Spectroscopy for Enhanced Detection of Surface Binding under Flow Injection Analysis Conditions

Evanescent-Wave Cavity Ring-Down Spectroscopy for Enhanced Detection of Surface Binding under Flow Injection Analysis Conditions

New ultrahigh vacuum setup and advanced diagnostic techniques for studying a-Si:H film growth by radical beams

Optical properties of Y2O3 thin films doped with spatially controlled Er3+ by atomic layer deposition

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