The exciton–exciton annihilation
(EEA) process easily occurs
in monolayer transition metal dichalcogenides (TMDs) because of the
strong Coulomb interaction and quantum confinement effect, which enhance
the many-body interaction of excitons. This process can affect the
performance of the optoelectronic devices. It is crucial to examine
the effect of defect states on the EEA process and determine whether
it is comparable to that at the low excitation intensities, particularly
when applied to laser devices at a high exciton density. In this study,
femtosecond transient absorption spectroscopy was used to explore
the EEA process of four types of CVD-grown monolayer TMDs (i.e., WS2, WSe2, MoS2, and MoSe2).
We demonstrated that the defect-assisted EEA process of local excitons
is enhanced and plays a key role in the exciton relaxation process
at high exciton densities of approximately 1012 cm–2 below a Mott density of approximately 1013 cm–2. The measured EEA rates for WS2, WSe2, MoSe2, and MoS2 were 0.016,
0.026, 0.049, and 0.102 cm2/s, respectively, implying that
EEA is enhanced as defect states increase in monolayer TMDs. Our results
provide a profound insight into the effect of defect states on the
EEA process in monolayer TMDs at high exciton densities.