“…[11][12][13][14][15][16] Structural characterizations have been carried out using x-ray diffraction (XRD) with monochromatic Cu-K a radiation, transmission electron microscopy (TEM) (JEOL, JEM-2100, 200 kV), high resolution field emission scanning electron microscopy (FE-SEM), and energy dispersive x-ray analysis (EDAX). Detailed dielectric studies have been carried out using Agilent impedance analyser (4294A) along with a homemade Proportional-Integral-Derivative (PID)-controlled furnace.…”