2022
DOI: 10.1016/j.jpcs.2022.110695
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AC conductivity and electrical relaxation of a promising Ag2S-Ge-Te-Se chalcogenide glassy system

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Cited by 27 publications
(5 citation statements)
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“…The improved PL peak intensity manifested the decreased nonradiative recombination. The trap density of states (tDOS) curves derived by thermal admittance spectroscopy (TAS) measurements, [38,39] as displayed in Figure 4b, suggested a decrease in trap density at the shallow trap region between 0.31 and 0.37 eV after EDTA surface treatment. Shallow-level traps can serve as pathways for ion migration, which can compromise the intrinsic stability of both the perovskite film and device.…”
Section: Resultsmentioning
confidence: 99%
“…The improved PL peak intensity manifested the decreased nonradiative recombination. The trap density of states (tDOS) curves derived by thermal admittance spectroscopy (TAS) measurements, [38,39] as displayed in Figure 4b, suggested a decrease in trap density at the shallow trap region between 0.31 and 0.37 eV after EDTA surface treatment. Shallow-level traps can serve as pathways for ion migration, which can compromise the intrinsic stability of both the perovskite film and device.…”
Section: Resultsmentioning
confidence: 99%
“…The nano-crystallites were identi-ed as short-range order due to the structural alterations. 48 Using the XRD pattern of the as-prepared g-Se:Gr sample, we determined the average nano-crystallite size, the dislocation density (d), and micro-strain (3) 49,50 and their values are listed in Table 1. However, the appearance of any graphene crystallographic peak could not be conrmed by the XRD pattern as a signature of the incorporation of graphene in the host matrix.…”
Section: Resultsmentioning
confidence: 99%
“…The total conductivity expressed as a sum of DC and AC conductivity components could be derived from Jonscher's power law. where σ DC is the frequency-independent DC component of conductivity representing the thermally activated drift current, A is a pre-exponential factor, and s is the Universal Dielectric Response (UDR), also termed the power law exponent [65]. The value of s was deduced from the slope of the line fit obtained by the linear least square fitting method.…”
Section: Electrical Conductivity Analysismentioning
confidence: 99%