AC electrical properties of the mixed crystal (NH4)3H(SO4)1.42(SeO4)0.58

Louati, B.; Gargouri, M.; Guidara, K.; Mhiri, Tahar

doi:10.1016/j.jpcs.2004.09.011

Cited by 114 publications

(50 citation statements)

References 21 publications

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“…Table 1 summarizes the fitted values of A and n at different temperatures. It can be seen from the Table 1 that n is less than one for temperatures below 543 K and greater than 1 for the temperature at and above 543 K. The latter category corresponds to long-range diffusion of ions [26][27] .The observed frequency vs. conductivity behavior is explained by using jump relaxation model [28][29], according to which an ion jumps from a site to its neighbouring vacant site at low frequencies where as dispersion region is characterized by the random hopping of mobile ions and the conductivity is correlated to the forward-backward hopping of the ions leading to the long-range diffusion of ions at high frequency end [30][31]. The increase in ac conductivity could be attributed to the lowering of the activation barrier at higher frequencies as compared to that at lower frequencies [32].…”

Section: Impedance Analysismentioning

confidence: 96%

Dielectric Relaxation, Ionic Conduction and Complex Impedance Studies on NaNo3 Fast Ion Conductor

Kumar¹

2013

IJMSA

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AC conductivity, dielectric constant, loss and electric modulus of Sodium nitrate system have been studied in the frequency range from 1Hz to 10MHz and in the temperature range from 303 K to 563 K by employing impedance spectroscopy. The frequency dependent ac conductivity follows Jonscher's universal power law. Dimensionless frequency exponent (n), dispersion parameter (A) are determined. The change over frequency independent conductivity to frequency dependent conductivity at all temperatures shows the relaxation mechanism. The variation of real part of dielectric constant with frequency shows strong dispersion at low frequencies and saturation at high frequencies. The presence of peaks in the frequency plots of dielectric loss, imaginary parts of impedance and modulus are attributed to the relaxation processes. It is also confirmed by the temperature dependence study of real part of dielectric constant. The activation energy from relaxation processes and conductivity has been evaluated.

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Section: Impedance Analysismentioning

confidence: 96%

Dielectric Relaxation, Ionic Conduction and Complex Impedance Studies on NaNo3 Fast Ion Conductor

Kumar¹

2013

IJMSA

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“…Beyond a critical frequency the conductivity follows linearly which is expected due to the contribution of grains. 31 The values of exponent "s" and pre-exponent factor "A" for various temperatures above 383 K and are enlisted in Table II. It is observed that, with increasing temperature, the value of "s" increases where as log A decreases significantly.…”

Section: Resultsmentioning

confidence: 99%

Structural and dielectric studies of Co doped MgTiO3 thin films fabricated by RF magnetron sputtering

et al. 2014

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We report the structural, dielectric and leakage current properties of Co doped MgTiO3 thin films deposited on platinized silicon (Pt/TiO2/SiO2/Si) substrates by RF magnetron sputtering. The role of oxygen mixing percentage (OMP) on the growth, morphology, electrical and dielectric properties of the thin films has been investigated. A preferred orientation of grains along (110) direction has been observed with increasing the OMP. Such evolution of the textured growth is explained on the basis of the orientation factor analysis followed the Lotgering model. (Mg1-xCox)TiO3 (x = 0.05) thin films exhibits a maximum relative dielectric permittivity of ɛr = 12.20 and low loss (tan δ ∼ 1.2 × 10−3) over a wide range of frequencies for 75% OMP. The role of electric field frequency (f) and OMP on the ac-conductivity of (Mg0.95Co0.05)TiO3 have been studied. A progressive increase in the activation energy (Ea) and relative permittivity ɛr values have been noticed up to 75% of OMP, beyond which the properties starts deteriorate. The I-V characteristics reveals that the leakage current density decreases from 9.93 × 10−9 to 1.14 × 10−9 A/cm2 for OMP 0% to 75%, respectively for an electric field strength of 250 kV/cm. Our experimental results reveal up to that OMP ≥ 50% the leakage current mechanism is driven by the ohmic conduction, below which it is dominated by the schottky emission.

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“…According to Mott's variable range hopping (VRH) mechanism of charge transport the following relations are taken into consideration [7][8][9] :…”

Section: Resultsmentioning

confidence: 99%

Charge transport mechanism in intercalated polypyrrole aluminum‐pillared montmorillonite clay nanocomposites

Shakoor

Rizvi

Hina

2011

J of Applied Polymer Sci

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Nanocomposites based on intercalated conducting polypyrrole (PPy) into the galleries of inorganic aluminum-pillared Montmorillonite (Al-PMMT) clay with varying concentrations of Al-PMMT were prepared by in situ chemical polymerization. The intercalation was confirmed by X-ray diffraction pattern. Charge transport mechanism in these composites was investigated by temperature dependent direct current conductivity measurements. An increase in DC conductivity value on addition of (Al-PMMT) clay in the composites at all temperatures and a transition from three-dimensional (3D) Mott's variable range hopping (VRH) process in pristine PPy to onedimensional (1D) Mott's VRH process in the intercalated polymer composites has been observed. This transition in charge transport mechanism of PPy from 3D VRH to 1D VRH on intercalation has been interpreted in terms of straightening and linearization of polymer chains and decrease in inter-chain interactions in the intercalated PPy. Enhancement in mechanical properties and increase in thermal stability of the nanocomposites was also observed with the increase in weight percentage of Al-PMMT in PPy-Al-PMMT composites.

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AC electrical properties of the mixed crystal (NH4)3H(SO4)1.42(SeO4)0.58

Cited by 114 publications

References 21 publications

Dielectric Relaxation, Ionic Conduction and Complex Impedance Studies on NaNo3 Fast Ion Conductor

Dielectric Relaxation, Ionic Conduction and Complex Impedance Studies on NaNo3 Fast Ion Conductor

Structural and dielectric studies of Co doped MgTiO3 thin films fabricated by RF magnetron sputtering

Charge transport mechanism in intercalated polypyrrole aluminum‐pillared montmorillonite clay nanocomposites

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